Rapid implementation method for comprehensive test process

Abstract

The invention relates to a rapid implementation method for a comprehensive test process. The method comprises the following steps: classifying test functions according to hardware interface types of ato-be-tested system; designing a test function unit for each test function category; enabling all test function units to adopt unified interface parameters; designing a test configuration informationinterface, and establishing a mapping relationship between configuration information and each test function unit; establishing a corresponding relationship between the test flow demand and test flowconfiguration information, storing the test configuration information in a configuration file, wherein one row in the file corresponds to one test item; sequentially reading each piece of configuration information from the configuration file, analyzing and judging the test function types and the test function units corresponding to the test function types, transmitting the configuration information to the interface parameters of the test function units, completing the execution of the current test items by the test function units, and outputting test results through the interface parametersuntil all the test items are executed and the test process is completed.

Description

technical field [0001] This project belongs to the field of ground comprehensive testing, and provides a method for quickly realizing the comprehensive testing process of the measurement and control system. Background technique [0002] The various test functions of the comprehensive test system mainly send control instructions to the system under test through different hardware function boards such as analog, digital, and communication. validity judgment. The diversification and complexity of equipment are constantly increasing, which puts forward higher requirements for the ground comprehensive test system. However, in the current comprehensive test process, the test process is easy to change and the test process is quite different in different test states, including test items, test Criteria, etc. need to be redesigned and coded, and the traditional comprehensive test process design and development mode are likely to cause problems such as repeated design, low developmen...

AI Technical Summary

Problems solved by technology

The diversification and complexity of equipment is constantly increasing, which puts forward higher requirements for the ground comprehensive test system. However, in the current comprehensive test process, the test process is easy to change and the test process is quite different in different test states, including test items, test Criteria, etc. need to be redesigned and coded. The traditional comprehensive test process design and development mode are likely to cause problems such as repeated design, low development efficiency, and high maintenance costs.

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