Test system, memory test method and test device

Abstract

The disclosure provides a test system, a memory test method and a test device, and relates to the technical field of semiconductors. The testing method includes: establishing a state machine according to multiple operating states of a memory block and instructions executable in each operating state; determining a plurality of candidate instructions corresponding to the current operating state according to the current operating state of the state machine; determining The running time between the current moment and an initial moment; randomly select a candidate instruction from each candidate instruction as the target instruction, and update the current running state according to the target instruction until the running time reaches a preset value; generate an instruction sequence according to all target instructions ; Determine the coverage rate of each target instruction in all instructions in the instruction sequence; when the coverage rate reaches a threshold, generate an execution file according to the instruction sequence; execute the execution file on the memory through the test machine.

Description

Technical field [0001] The present disclosure relates to the field of semiconductor technology, and in particular, to a test system, a test method of memory and a test device of a memory. Background technique [0002] With the development of semiconductor technology, the performance of memory is gradually improved. Existing memory includes dynamic random access memory (DRAM), random access memory (RAM), and the like. In order to detect the performance of the memory, the memory is often required to test the memory, each test item for a detection purpose. [0003] Currently, when the memory is detected, the artificial writing test item is required as needed, and the memory is detected according to the various test items written. However, the combination of artificial writing test items is fixed and limited, while the user uses unlimited combination of the function of the memory, so that the existing test mode is less efficient, and the test item The coverage is small, causing the t...

AI Technical Summary

Problems solved by technology

However, the combination and quantity of manually written test items are fixed and limited, while the user's combination of various functions of the memory is unlimited and not fixed, so that the efficiency of the existing test methods is low, and the number of test items The coverage rate is small, so the test effect needs to be improved

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