Semiconductor deposition process compensation method, compensation device and semiconductor deposition equipment

A technology of deposition process and compensation method, which is applied in the direction of metal material coating process, vacuum evaporation plating, coating, etc., can solve the problems of inflexibility and incomplete parameter compensation method, and achieve the effect of low fitting difficulty

Active Publication Date: 2022-06-17
BEIJING NAURA MICROELECTRONICS EQUIP CO LTD
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0006] The purpose of the present invention is to propose a semiconductor deposition process compensation method, compensation device and deposition equipment, which can solve the problem of incomplete and inflexible existing parameter compensation methods

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  • Semiconductor deposition process compensation method, compensation device and semiconductor deposition equipment
  • Semiconductor deposition process compensation method, compensation device and semiconductor deposition equipment
  • Semiconductor deposition process compensation method, compensation device and semiconductor deposition equipment

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Embodiment Construction

[0043] The present invention will be described in more detail below with reference to the accompanying drawings. While preferred embodiments of the present invention are shown in the drawings, it should be understood that the present invention may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.

[0044] An embodiment of the present invention provides a semiconductor deposition process compensation method, figure 2 A flow chart of steps of a semiconductor deposition process compensation method according to an embodiment of the present invention is shown. Please refer to figure 2 , the semiconductor deposition process compensation method includes the following steps:

[0045] Step 1: Before executing the current process step, determine whether parameter compensa...

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Abstract

The invention discloses a semiconductor deposition process compensation method, a compensation device, and semiconductor deposition equipment, wherein the deposition process compensation method includes: Step 1: Before executing the current process step, it is judged whether parameter compensation needs to be performed on the process parameter value of the current process step, If yes, obtain the current target consumption value, and calculate the compensated process parameter value according to the preset multiple target consumption values ​​and the parameter compensation value corresponding to each target consumption value; Step 2: According to the The process parameter value is used to execute the current process step; wherein, the parameter compensation value includes at least one of the following: deposition time compensation value, target-base distance compensation value, and sputtering power compensation value. The beneficial effect of the present invention is that the user can freely choose to turn on time compensation, sputtering power compensation or target-based distance compensation independently, and can also turn on any two of them at the same time, or turn on the three ways together, and in the steps of each process formula Flexible configuration.

Description

technical field [0001] The present invention relates to the technical field of semiconductor processes, and in particular, to a compensation method, compensation device and semiconductor deposition equipment for a semiconductor deposition process. Background technique [0002] With the rapid development of the semiconductor manufacturing industry, more and more semiconductor devices are produced and used, such as: magnetron PVD (Physical Vapor Deposition, Physical Vapor Deposition) devices, etc. These semiconductor devices are required to coat substrates Apply the target of the corresponding material. like figure 1 Shown is a typical magnetron PVD equipment structure diagram, including equipment cavity 1, target material 2 used in sputtering deposition, magnetron 5, sputtering power supply output power to target material 2, substrate holder 3 for The substrate 4 is contained, and the substrate holder 3 can be driven by a motor or driven by a cylinder to move up and down, s...

Claims

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): C23C14/54C23C14/35
CPCC23C14/54C23C14/35C23C14/3407
Inventor曹光英
OwnerBEIJING NAURA MICROELECTRONICS EQUIP CO LTD