Quantitative evaluation method for wheat seedling pattern characteristics

A technique of quantitative evaluation and seedlings, applied in the interpretation of photos, grain cultivation, etc., can solve the problems of inability to take into account the individual differences of seedlings, the one-sidedness of the survey results, the extension of the survey period, etc., and achieve the effect of facilitating field management or measures to supplement and delete seedlings.

Active Publication Date: 2020-09-29
YANGZHOU UNIV
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Problems solved by technology

The most common method used above not only fails to take into account the differences among individual seedlings, but the survey results are one-sided; in addition, large-scale surveys are easily restricted by environmental conditions such as weather, which prolongs the survey period and inefficiencies

Method used

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  • Quantitative evaluation method for wheat seedling pattern characteristics
  • Quantitative evaluation method for wheat seedling pattern characteristics
  • Quantitative evaluation method for wheat seedling pattern characteristics

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Embodiment Construction

[0032] The implementation method of the present invention will be described in detail below in conjunction with the quantitative description of the distribution pattern of wheat seedlings in specific seedling fields.

[0033] Such as Figure 1-Figure 5 Shown are images of five sampling areas where wheat seedlings were sampled at the 1-2 leaf stage in experimental plots with different seedling densities, and the corresponding wheat seedling densities of each image are: 135 plants / m 2 , 180 plants / m 2 , 225 plants / m 2 , 270 plants / m 2 and 315 plants / m 2 .

[0034] The specific sampling method is as follows: pre-fabricate several sampling frames with a side length of 50cm×50cm, place them at the predetermined sampling positions in the target wheat field, and use a drone equipped with a high-definition camera. The drone uses DJI GS Pro image acquisition control software, remote control The drone shoots images over the sampling frame to obtain images of the seedlings in the sam...

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Abstract

The invention relates to a quantitative evaluation method for wheat seedling pattern characteristics. The method comprises the following steps: 1, defining a plurality of sampling areas, respectivelyfixing all seedling positions Ai in each sampling area, enabling the total number of fixed points to be n, respectively connecting each fixed point Ai with an adjacent fixed point to form a pluralityof connecting lines which are not crossed or overlapped, and respectively marking the lengths of the connecting line as X1, X2... Xm in the unit of cm; 2, calculating distance characteristics in the sampling area and expressing the distance characteristics as the distance number ratio V =, X being the sum of X1, X2... Xm, and n being the total number of seedling fixed points; 3, calculating a variation index of seedling distribution in the sampling area; and 4, calculating a uniformity difference of the sampling area, equally dividing the sampling area into 4-6 sub-areas, and counting a seedling fixed point number of each sub-area, and the uniformity difference being a variance of the seedling fixed point number of the sub-areas.

Description

technical field [0001] The invention relates to the technical field of quantitative evaluation of field distribution of plant seedlings, in particular to a quantitative evaluation method for pattern characteristics of wheat seedlings. Background technique [0002] The pattern characteristics of wheat seedlings are important indicators to reflect the spatial pattern of wheat growth, which lays the foundation for constructing the optimal growth space of wheat seedlings. A reasonable wheat seedling pattern is beneficial to the growth of wheat seedlings and can give full play to the growth potential of wheat. [0003] There are many factors that affect the growth pattern of wheat seedlings, including sowing density, sowing method, farming method, meteorological factors (changes in rainfall and temperature will affect the growth of wheat seedlings), soil factors (the content of moisture and salt in the soil and soil temperature) are important factors that affect the pattern of se...

Claims

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Application Information

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IPC IPC(8): G01C11/04A01G22/20
CPCA01G22/20G01C11/04
Inventor 刘涛朱奕雯武威李春燕孙成明朱新开郭文善
Owner YANGZHOU UNIV
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