Method for establishing XRF-method standard curves of same-substrate wide-range SCR denitration catalyst

A denitrification catalyst and standard curve technology, which is applied in the field of XRF standard curve establishment of wide range SCR denitrification catalysts with the same substrate, which can solve the problems of moisture-absorbing sample surface, inconsistent and loose substrates, etc.

Inactive Publication Date: 2020-10-23
HUADIAN QINGDAO ENVIRONMENTAL TECHNOLOCY CO LTD
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Problems solved by technology

[0005] However, there are several problems in the actual operation of the above method. First: during the weighing process, the high-purity oxide reagent is easy to absorb moisture, resulting in inaccurate weighing; second: the mixed sample weighed by this method It is difficult to mix evenly; third:

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  • Method for establishing XRF-method standard curves of same-substrate wide-range SCR denitration catalyst
  • Method for establishing XRF-method standard curves of same-substrate wide-range SCR denitration catalyst
  • Method for establishing XRF-method standard curves of same-substrate wide-range SCR denitration catalyst

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Embodiment Construction

[0024] The invention provides a method for establishing an XRF method standard curve of a wide-range SCR denitration catalyst with the same substrate, comprising the following steps:

[0025] (1) Determine the detection range of each component: According to the current production process formula, establish a standard curve with a wide test range as much as possible to meet the quantitative detection requirements of various types of SCR denitration catalysts. Among them, TiO 2 The detection range of 96.65%-77.00%, WO 3 The detection range is 0.50%-8.00%, V 2 O 5 The detection range is 0.15%-4.00%, SiO 2 The detection range is 0.50%-4.00%, P 2 O 5 The detection range is 0.20%-2.00%, MoO 3 The detection range is 2.00%-5.00%, as shown in Table 1:

[0026] Table 1 The mass fraction of each substance in the standard sample of SCR denitration catalyst

[0027]

[0028] (2) Calculate and weigh the added amount of each substance: according to the ratio of the above-mentioned...

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Abstract

The invention discloses a method for establishing XRF-method standard curves of a same-substrate wide-range SCR denitration catalyst. The method comprises the following steps: (1) determining the detection range of each component; (2) calculating and weighing the addition amount of each substance; (3) mixing the materials; (4) preparing a sample slice; and (5) establishing the standard curve of each component. The standard curves of the six components established by the method disclosed by the invention show a better linear relationship, and can meet the detection requirements of laboratorieson the chemical components of the SCR denitration catalyst.

Description

technical field [0001] The invention specifically relates to a method for establishing an XRF method standard curve of a wide-range SCR denitration catalyst with the same substrate. Background technique [0002] The chemical composition of SCR denitration catalyst is an important indicator for fresh catalyst acceptance and catalyst performance analysis in operation, and directly affects the catalytic denitration effect. [0003] The principle of elemental qualitative and quantitative analysis of the chemical composition of SCR denitration catalyst by X-ray fluorescence spectrometer is: the atoms of the element are excited by high-energy radiation to cause the transition of inner electrons, and at the same time emit X-rays with a certain characteristic wavelength, according to the measured The wavelength and intensity of the spectral lines are used for elemental qualitative and quantitative analysis, and the range of detectable elements is element 9 (F) to element 92 (U). ...

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Application Information

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IPC IPC(8): G01N23/223G01N23/2202B01J27/19
CPCB01J27/19G01N23/2202G01N23/223G01N2223/076G01N2223/1016G01N2223/312
Inventor 范娟于宁邓忠玉贺明洁高春昱孟凡强王正上秦一鸣陈华孙文强赵雪刘莉樊亮徐振远孙龙王昌岭
Owner HUADIAN QINGDAO ENVIRONMENTAL TECHNOLOCY CO LTD
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