Novel cryo-scanning electron microscope sample table and sampling method

A scanning electron microscope and sample stage technology, applied in the direction of measuring devices, instruments, scientific instruments, etc., can solve the problems of low work efficiency, time-consuming and labor-consuming, etc., achieve high work efficiency, convenient use and operation, and reduce the effect of ice crystals

CN111855720APending Publication Date: 2020-10-30GUANGZHOU INST OF ENERGY CONVERSION - CHINESE ACAD OF SCI
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Publication Date
2020-10-30

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Abstract

The invention discloses a novel cryo-scanning electron microscope sample table, which comprises a base, lower sample tubes and upper sample tubes, wherein a plurality of sample mounting grooves are formed in the base and vertically penetrate through the upper side surface and the lower side surface of the base; the lower sample tubes and the upper sample tubes are identical in size and matched innumber, the flat ends of the lower sample tubes and the flat ends of the upper sample tubes are in butt joint pairwise and then inserted into the sample mounting grooves, and the inner diameter of theupper ends of the sample mounting grooves is smaller than the outer diameter of the flat ends of the lower sample tubes; and the base is further provided with an adapter for transferring the base toa cooling table in a sample preparation cabin of a freezing transmission system and realizing fixation. The novel cryo-scanning electron microscope sample table is suitable for scanning electron microscope observation and analysis of various liquid, semi-liquid or foam samples, and has the advantages of simple structure and convenience in use and operation; the samples are directly in contact witha refrigerant, the freezing rate is high, and the generation of ice crystals is avoided or reduced; and a plurality of samples are simultaneously introduced, so that the working efficiency is high and the applicability is wide.
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Description

technical field

[0001] The invention relates to the technical field of scanning electron microscope sample preparation, in particular to a novel frozen scanning electron microscope sample stage and a sampling method for liquid, semi-liquid or foam samples. Background technique

[0002] Cryo-SEM (Cryo-SEM) is an ultra-low temperature freezing sample preparation and transmission technology using scanning electron microscopy, which can realize direct observation of liquid, semi-liquid and samples sensitive to electron beams, such as biology and polymer materials. After the sample is subjected to ultra-low temperature freezing, fracture, coating (gold spraying / carbon spraying) and other sample preparation treatments, it is transferred to the cold stage in the electron microscope (the temperature can be as low as -185°C) through the freezing transmission system for electron microscope observation and analysis. Among them, the rapid freezing technology enables the water in the sam...

Examples

Embodiment

[0029] refer to Figure 1 to Figure 5 , is a new type of cryo-scanning electron microscope sample stage, which is used for sample sampling of liquid, semi-liquid or foam, including a base 1, a lower sample tube 2 and an upper sample tube 3; the base 1 is provided with several sample mounting slots 4, The sample installation groove 4 vertically runs through the upper and lower sides of the base 1; the lower sample tube 2 and the upper sample tube 3 have the same size and match in quantity, and the lower sample tube 2 and the upper sample tube 3 are connected in pairs, and then the lower sample tube 2 Inserted in the sample installation groove 4, the inner diameter of the upper end of the sample installation groove 4 is smaller than the outer diameter of the flat end of the lower sample tube 2; the base 1 is also provided with a mounting plate for transferring the base 1 to the cooling platform in the sample preparation chamber of the freezing transmission system and realizing fi...