3 results about "Optical limiter" patented technology

This invention relates to the field of optical imaging system technology, and more particularly to an optical imaging system for continuous protection against pulsed laser-induced blindness. The system includes a secondary imaging optical system, an imaging detector, a nonlinear absorption-type optical limiter, and a two-dimensional moving unit. The secondary imaging optical system comprises a primary imaging optical component and a secondary imaging optical component. After the light beam enters the secondary imaging optical system, it is focused by the primary imaging optical component to form a primary image focal point, and then imaged onto the imaging detector by the secondary imaging optical component. The nonlinear absorption-type optical limiter is mounted on the two-dimensional moving unit and positioned near the primary image plane of the secondary imaging optical system's principal optical axis. The two-dimensional moving unit drives the movement of the nonlinear absorption-type optical limiter, allowing the incident light beam to pass through different positions on the nonlinear absorption-type optical limiter. The advantage is that it provides continuous laser protection for the imaging detector, achieving automatic protection for the optical imaging system.

The utility model relates to the field of non-linear optics, and particularly provides an in-situ electrochemical Z scanning spectrum system which comprises a laser and a light detector which are arranged at the same height, a focusing lens is arranged between the laser and the light detector, a sample moving mechanism is further arranged between the focusing lens and the light detector, the focusing lens is a plano-convex lens, and the sample moving mechanism is arranged between the plano-convex lens and the light detector. One side of the plane faces the sample moving mechanism, the focus of the focusing lens is located at the light height position corresponding to the length center position of the sample moving mechanism, the power-up mechanism is fixedly arranged on the sample moving mechanism, and a to-be-tested sample is arranged on the side, close to the focusing lens, of the power-up mechanism. According to the power-up mechanism, the nonlinear optical characteristics of the sample are changed by applying voltage, and in-situ detection of the electrically-controlled nonlinear optical response of the material is achieved. The dynamic behavior of the material under the action of an electric field can be researched, important support is provided for developing tunable optical devices such as electro-optical modulators and dynamic optical limiters, and application and development of photoelectric functional materials are promoted.