Interference measuring instrument based on multimode waveguide light field transverse mode

A technology of transverse mode and interferometry, applied in the field of interferometers, can solve the problems of difficulty in generating multi-particle quantum entanglement states, and difficulty in achieving measurement accuracy.

Inactive Publication Date: 2010-03-10
ZHEJIANG UNIV
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

However, the realization of this method depends on the generation of multi-particle quantum entanglement state, and the generation of multi-particle quantum entanglement state is extremely difficult, so this method of improving measurement accuracy is difficult to achieve

Method used

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  • Interference measuring instrument based on multimode waveguide light field transverse mode
  • Interference measuring instrument based on multimode waveguide light field transverse mode
  • Interference measuring instrument based on multimode waveguide light field transverse mode

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Embodiment Construction

[0021] Such as figure 1 As shown, the interferometer based on the transverse mode of the optical field in the multimode waveguide includes a connected light source component 1, a mode switching component 2, a sensing component 3, and a related measurement component 4. The mode switching component 2 has multiple multimode waveguide directions Coupler 5, sensing component 3 has multiple multimode waveguide phase modulators 6, and related measurement component 4 has a plurality of connected Y-type splitters 7, photodetectors 8, differentiators 9, and multiple differentiators 9 and The correlators 10 are connected.

[0022] After the multiple independent light fields (beams) in the mode superposition state generated by the light source component pass through the mode exchange component 1, the mode exchange between multiple light fields is realized, and these fields pass through the phase modulator 8 in the sensor component 3 The role of carrying the information of the phase to be...

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Abstract

The invention discloses a transverse made interferometer based on the optical field in the multimode waveguide. It includes connected light source element, mode exchanging element, sensing element andinterrelated detection element. The mode exchanging element has many multimode waveguide direction couplers, the sensing element has many multimode waveguide phase modulators, and the interrelated detection element has many connected Y type banqiqi, photo detectors and differentials, the differentials connected to correlators. The invention uses classic field to realize the classic imitation wayof many particle quantum entangled state, this kind of classic imitation produces similar quantum entangled non-locality, the invention can reach to phase position detection accuracy in direct proportion to N-1, and reach to the detection accuracy's Heisenberg limitation as the quantum entangled plan. What's more important is the proposal disclosed by the invention has important potential application in the art of gravity wave detection, micronano displacement test, and optical top and optical sonar detection.

Description

technical field [0001] The invention relates to an interferometer, in particular to an interferometer based on a transverse mode of an optical field in a multimode waveguide. Background technique [0002] Precision measurement is a technology of great significance in scientific research and industrial production, among which precision measurement based on the principle of optical interference is especially widely used. The basic principle of this interferometry is very simple. A beam splitter is used to divide a beam of coherent light into two beams, one of which is used as a reference beam, and the other beam passes through a phase modulator to generate a phase difference. The two beams of light are related to the physical quantity, and then the two beams of light converge again. Due to the generation of phase difference, the two beams of light gathered together interfere, and the output light intensity changes with the transformation of the phase difference. In this way, t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B9/02
Inventor 符建王冬云
Owner ZHEJIANG UNIV
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