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Method for detecting and extracting chromosome contour based on directional searching

A contour detection and extraction method technology, applied in the field of image processing, can solve problems such as contour breakage, and achieve the effect of improving contour breakage and reducing the amount of computation

Inactive Publication Date: 2009-04-22
GUANGDONG VTRON TECH CO LTD
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  • Description
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Problems solved by technology

like figure 2 Shown is the detection method that each prior art adopts to chromosome figure 1 The achieved contour extraction results show that the contours detected by existing contour detection and extraction techniques have fractures

Method used

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  • Method for detecting and extracting chromosome contour based on directional searching
  • Method for detecting and extracting chromosome contour based on directional searching
  • Method for detecting and extracting chromosome contour based on directional searching

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Embodiment

[0046] The realization flowchart of a kind of chromosome outline detection and extraction method based on directional search of the present invention is as follows Figure 9 As shown, among them, S is the first contour point of the image; C is the currently confirmed contour point; P is the previous contour point of C; N is the next contour point of C; The possible point set of the next contour point in points; RL is the set of contour points that have been searched; BL is the set of backtracking points; EL is the point that has been searched; NPO is the point with the highest priority in NPL:

[0047] The first step is to collect the original chromosome map (such as figure 1 shown) to perform image filtering preprocessing to remove miscellaneous information that has nothing to do with chromosomes, so as to achieve better results. The median filtering method used here can better preserve the edge characteristics of the original chromosome map.

[0048] The second step is to...

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Abstract

The invention discloses a chromosome contour detecting and extracting method based on directed search, comprising: giving binaryzation treatment to collected images of chromosome; making a point on the contour of the chromosome as a starting point in the image after the binaryzation treatment; searching for and extracting border information continuously along the edge of the chromosome contour in a clockwise direction till reaching the detecting and extracting starting point again, so as to detect the contour of the chromosome wholly. The detecting and extracting method disclosed by the invention satisfies the requirements that contours of objects should be accurately detected in medical treatment fields such as chromosome analysis, cell research, pathological analysis, etc. The method of the invention improves automation level of segregating and incising overlapped and adherent chromosomes according to the contour, perfects the shortcomings of traditional computing methods that the contour fractures, the contour is incontinuous and unevenness details of the contour are ignored, and improves the accuracy of detecting results, furthermore operand is greatly reduced.

Description

technical field [0001] The invention belongs to the technical field of image processing, and relates to a method for detecting and extracting the contour of a chromosome image based on directional search, in particular to an automatic segmentation method and a method for counting the number of chromosomes used in a chromosome analysis system. Background technique [0002] Chromosomal karyotype analysis has significant guiding significance for the diagnosis, treatment and prevention mechanisms of various diseases, and it is the basis of cytogenetics research. At present, a variety of karyotype analysis systems and methods have been developed and developed at home and abroad. Most of them use cameras with CCD / CMOS image sensor technology to capture chromosome images, and then combine image processing technology and computer processing technology to collect and analyze chromosome images. Processing, shape recognition, segmentation, analysis and other operations can replace trad...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/54G06K9/46G06K9/38G06K9/40
Inventor 邹勇图杨月
Owner GUANGDONG VTRON TECH CO LTD
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