Simulation test method of integrated circuits
A technology for integrated circuits and simulation testing, applied in the direction of electrical digital data processing, special data processing applications, instruments, etc., can solve problems that affect chip design progress, time-consuming, lack of recovery, etc., and achieve the effect of shortening the simulation time
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] Such as figure 1 As shown, the present invention divides the simulation test time into a plurality of simulation sections, saves the data of the simulation site at different time points specified, and then enables the multi-thread simulation program, and each thread recovers the simulation data of a time point to start the simulation test. The original single-threaded simulation process is divided into multiple simulation threads that can be executed in parallel, which greatly reduces the time for re-simulation.
[0031] Such as figure 2 As shown, the realization of the present invention can be divided into the following three stages:
[0032] Phase 1: Data Preparation
[0033] This stage is mainly to generate lists of various data types, and generate verilog tasks for data saving (save) and data restoration (restore) based on these lists. The specific process is as follows:
[0034] (1), read the netlist (netlist) of the integrated circuit through EDA software, acc...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com