Arrangement and method for measuring a magnetic material in a region of action

A technology of active area, magnetic material, applied in the direction of magnetic property measurement, magnetization measurement, diagnostic recording/measurement, etc., can solve complex, expensive, time-consuming and other problems, achieve accurate and safe operation, reduce hazardous waste, and easily effect used

Inactive Publication Date: 2012-02-08
KONINKLIJKE PHILIPS ELECTRONICS NV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, this system and method is time consuming, complex and expensive

Method used

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  • Arrangement and method for measuring a magnetic material in a region of action
  • Arrangement and method for measuring a magnetic material in a region of action
  • Arrangement and method for measuring a magnetic material in a region of action

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Embodiment Construction

[0034] figure 1An object to be examined by means of a magnetic particle spectrometer (MPS) device 10 according to the invention is shown. The MPS device 10 comprises a transmitting coil 12 and a receiving coil 14 which are arranged coaxially with each other. The receiving coil 14 is arranged coaxially within the transmitting coil 12 . The transmit and receive coils are axisymmetric about a common axis 16 . Probe 18 is disposed on shaft 16 within receiving coil 14 . Transmitting coil 12 generates a magnetic field 20 which is homogeneous within transmitting coil 12 and axisymmetric about axis 16 . The probe 18 is disposed in a probe chamber 22, which is located in the center of the receiving coil.

[0035] Transmit coil 12 is configured to provide a uniform and variable magnetic field within probe chamber 22 . The receiving coil 14 is configured to receive particles 100 ( figure 1 not shown in the magnetization response). figure 1 In, the probe is any object, however, thi...

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PUM

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Abstract

The present invention relates to an arrangement (10) for measuring small amounts of a first medium (202) in a third medium (206) and / or of a substance in the first medium (202), said third medium (206) comprising said first medium (202) and a second medium (204), said second medium (204) comprising a known concentration of a magnetic material, wherein said arrangement comprises: - magnetization means (12) for providing a variable magnetic field (20) in a region of action (22), in which a probe (18; 208) of said third medium (206) is placed for measurement, - receiving means (14) for acquiring a detection signal of the magnetization of said probe (12) in said region of action (22) after application of said variable magnetic field (20), and - evaluation means (214) for evaluating said detection signal and comparing it to calibration measurements of the magnetization of at least one calibration sample to derive an information about the amount of said first medium (202) in said third medium (206) and / or of said substance in said first medium (202).

Description

technical field [0001] The invention relates to a device for measuring a small amount of a first medium in a third medium and / or a small amount of a substance in the first medium. Furthermore, the invention relates to a method for measuring a small amount of a first medium in a third medium and / or a small amount of a substance in the first medium. Background technique [0002] Such a device is known from Biederer, S. and Gleich, B. (2008), "A Spectrometer for Magnetic Particle Imaging" in IFMBE Proceedings, Volume 22, pp. 2313-2316. In the device described in this publication, a magnetic particle imaging scanner without spatial encoding is used. The spectrometer comprises a sending coil for applying a time-varying magnetic field to the nanoparticles of the probe to be measured and a receiving coil for detecting the magnetization of the particles in the probe chamber. The spectrometer detects the concentration of magnetic particles in the probe chamber since the level of ma...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/12A61B5/05
CPCA61B5/05A61B5/0515G01R33/1215
Inventor G·尼撒托H·M·B·伯芬
Owner KONINKLIJKE PHILIPS ELECTRONICS NV
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