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Method and system for testing circuit board

A test method and test system technology, applied in the direction of electronic circuit test, etc., can solve problems such as unproposed solutions and difficulty in further improving test speed, so as to reduce the time required for testing, improve test speed, and save manpower and cost Effect

Inactive Publication Date: 2012-08-15
BEIJING STAR RIVER COMTES SCI & TECH DEV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0013] In addition, for other types of tests, there is also the problem that it is difficult to further improve the test speed, and no effective solution has been proposed for this problem

Method used

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  • Method and system for testing circuit board
  • Method and system for testing circuit board
  • Method and system for testing circuit board

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Embodiment Construction

[0047] Generally, in order to improve the performance of the CPU, CPU manufacturers usually increase the clock frequency of the CPU and increase the cache capacity. However, the frequency of the CPU is getting faster and faster at present. If the performance is improved by increasing the CPU frequency and increasing the cache, it will often be restricted by the limitation of the manufacturing process and the high cost. Although increasing the clock frequency of the CPU and increasing the cache capacity can indeed improve the performance, it is very difficult to implement this way of improving the performance with the help of the CPU performance. Moreover, even if the processing rate and buffer memory of the CPU can be greatly improved, the execution unit (processing resource) of the CPU still cannot be fully utilized when the circuit board test is actually performed.

[0048] In view of the above problems, according to an embodiment of the present invention, a method for testi...

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Abstract

The invention discloses a method and a system for testing a circuit board. The method comprises the step of testing the circuit board corresponding to testing equipment when each piece of testing equipment is controlled by a thread allocated to the testing equipment under the condition that a thread is allocated for each piece of testing equipment in a plurality of pieces of testing equipment by the system, wherein a plurality of pieces of testing equipment are tested in a parallel mode. According to the method and the system, a plurality of threads are established for controlling and testing a plurality of pieces of testing equipment respectively, so that resources of a processor can be used more effectively, the time for testing can be effectively reduced, the testing speed is increased, and the labor and the cost are saved.

Description

technical field [0001] The present invention relates to the field of circuit device testing, and in particular, relates to a circuit board testing method and system. Background technique [0002] The test of the circuit board is mainly divided into online test and functional test, wherein the online test is realized by an online tester (In Circuit Tester, referred to as ICT), and the functional test is completed by a functional tester (Functional Circuit Tester, referred to as FCT). This test process is also called dynamic test (power on). [0003] Specifically, an online tester is also called a circuit board fault analyzer. The test performed by this device is a static test, which is produced by a printed circuit board assembly (PCBA) that is necessary for many electronics companies. Test Equipment. The online tester is like a powerful multimeter, an instrument that scans and inspects all components on the circuit board in sequence. Such as figure 1 As shown, the conven...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 林杰清
Owner BEIJING STAR RIVER COMTES SCI & TECH DEV
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