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Method and device of acquiring experiment design table of artificial microstructure

A technology of artificial microstructure and acquisition method, applied in the field of artificial microstructure experiment, can solve the problems of time-consuming, high cost, labor consumption, etc., and achieve the effect of reducing the number of experiments

Active Publication Date: 2013-06-05
KUANG CHI INST OF ADVANCED TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

Arranging so many electromagnetic simulation tests and artificial microstructures is very time-consuming, labor-intensive, and very expensive

Method used

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  • Method and device of acquiring experiment design table of artificial microstructure
  • Method and device of acquiring experiment design table of artificial microstructure
  • Method and device of acquiring experiment design table of artificial microstructure

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Embodiment Construction

[0053] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work shall fall within the protection scope of the present invention.

[0054] See figure 2 , Is a schematic flow chart of the first embodiment of the method for obtaining an experimental design table of artificial microstructures of the present invention; the method of this embodiment includes:

[0055] S101: Determine the number of geometric parameter factors of the artificial microstructure to be tested, the number of values ​​of each geometric parameter factor, and the corresponding parameter value.

[0056...

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Abstract

The invention discloses a method and a device of acquiring an experiment design table of an artificial microstructure. The method comprises confirming the number of geometrical parameter factors of an artificial microstructure to be tested, the number of values of each geometrical parameter factor and the parameter values corresponding to each geometrical parameter factor, choosing a left-circulating Latin square uniform design method to build a uniform design table according to the number of the geometrical parameter factors and the number of the values of each geometrical parameter factor, and building and obtaining the experiment design table according to the confirmed values of each geometrical parameter factor and the uniform design table. The method and the device of acquiring the experiment design table of the artificial microstructure can reduce the times of experiments under the condition that an experiment result is not influenced, and the undistorted experiment result is obtained in the experiments of a small number.

Description

Technical field [0001] The invention relates to the field of artificial microstructure testing, in particular to a method and device for obtaining an artificial microstructure test design table. Background technique [0002] Artificial electromagnetic material, also called metamaterial, is an artificial synthetic material that can respond to electromagnetic waves. It consists of a substrate and artificial microstructures attached to the substrate. Because artificial microstructures are usually arranged by conductive materials, they have a certain The structure of the geometric pattern can therefore respond to electromagnetic waves, so that the metamaterial as a whole exhibits electromagnetic characteristics different from that of the substrate. Artificial microstructures play a vital role in the performance of electromagnetic materials. [0003] Measuring the electromagnetic properties of artificial microstructures is an important part of the design process of artificial electroma...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50G01R31/00
Inventor 刘若鹏季春霖刘斌易翔
Owner KUANG CHI INST OF ADVANCED TECH
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