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Method and device for obtaining experimental design table of artificial microstructure

A technology of artificial microstructure and design table, applied in measurement devices, calculations, special data processing applications, etc., can solve the problems of time-consuming, labor-intensive, and high cost, and achieve the effect of reducing the number of experiments

Active Publication Date: 2016-03-30
KUANG CHI INST OF ADVANCED TECH
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  • Summary
  • Abstract
  • Description
  • Claims
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Problems solved by technology

Arranging so many electromagnetic simulation tests and artificial microstructures is very time-consuming, labor-intensive, and very expensive

Method used

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  • Method and device for obtaining experimental design table of artificial microstructure
  • Method and device for obtaining experimental design table of artificial microstructure
  • Method and device for obtaining experimental design table of artificial microstructure

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Embodiment Construction

[0053] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0054] See figure 2 , is a schematic flow chart of the first embodiment of the method for obtaining the experimental design table of the artificial microstructure of the present invention; the method of the present embodiment includes:

[0055] S101: Determine the number of geometric parameter factors of the artificial microstructure to be tested, the number of values ​​of each geometric parameter factor and its corresponding parameter value.

[0056] Specificall...

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Abstract

The invention discloses a method and a device of acquiring an experiment design table of an artificial microstructure. The method comprises confirming the number of geometrical parameter factors of an artificial microstructure to be tested, the number of values of each geometrical parameter factor and the parameter values corresponding to each geometrical parameter factor, choosing a left-circulating Latin square uniform design method to build a uniform design table according to the number of the geometrical parameter factors and the number of the values of each geometrical parameter factor, and building and obtaining the experiment design table according to the confirmed values of each geometrical parameter factor and the uniform design table. The method and the device of acquiring the experiment design table of the artificial microstructure can reduce the times of experiments under the condition that an experiment result is not influenced, and the undistorted experiment result is obtained in the experiments of a small number.

Description

technical field [0001] The invention relates to the field of artificial microstructure experiments, in particular to a method and device for obtaining an experimental design table of artificial microstructures. Background technique [0002] Artificial electromagnetic materials, also known as metamaterials, are synthetic materials that can respond to electromagnetic waves. They consist of a substrate and artificial microstructures attached to the substrate. Since artificial microstructures are usually arranged by conductive The structure of the geometric pattern is therefore able to respond to electromagnetic waves, so that the metamaterial as a whole exhibits electromagnetic properties different from that of the substrate. Artificial microstructures play a crucial role in the performance of electromagnetic materials. [0003] Measuring the electromagnetic properties of artificial microstructures is an important link in the design of artificial electromagnetic materials. In...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F17/50G01R31/00
Inventor 刘若鹏季春霖刘斌易翔
Owner KUANG CHI INST OF ADVANCED TECH
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