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Data test method, test library generating method and related device

A technology of data testing and testing library, applied in the field of data processing, can solve problems such as low restoration efficiency and affecting test efficiency, and achieve the effect of improving efficiency and avoiding backup

Inactive Publication Date: 2013-07-03
深圳市金蝶精斗云网络科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the prior art, when performing data backup, the data in the entire database is backed up; and, in many cases, many test cases need to use the original data for testing during operation, therefore, As a result, every time a test case is run, the original data in the entire database needs to be restored, and the restoration efficiency of the entire database is very low, which seriously affects the test efficiency

Method used

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  • Data test method, test library generating method and related device
  • Data test method, test library generating method and related device
  • Data test method, test library generating method and related device

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Embodiment Construction

[0015] Embodiments of the present invention provide a data testing method, a method for generating a test library, and related devices, which are used for efficient automatic data testing.

[0016] see figure 1 , an embodiment of the data testing method in the embodiment of the present invention includes:

[0017] 101. Extracting test data that needs to be tested according to the feature identification;

[0018] Extract the test data that needs to be tested according to the feature identification. Specifically, when establishing the test library, the database generation device adds feature marks to the test data entered by the user, so that different types of test data have different feature marks, so that when extracting the test data that needs to be tested, it can be targeted. Extract the corresponding test data to avoid processing the entire database at the same time.

[0019] The feature identifier is used to uniquely identify a type of test data; specifically, the fea...

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PUM

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Abstract

The embodiment of the invention discloses a data test method, a test library generating method and a related device, which are used for performing automatic test on data efficiently. The method provided by the embodiment of the invention comprises the following steps of: extracting test data which are required to be tested according to a characteristic identifier; backing up the test data to obtain a data backup file; operating a test case according to the test data; and restoring the test data which is obtained after the test case is operated by using the data backup file.

Description

technical field [0001] The invention relates to the field of data processing, in particular to a data testing method, a method for generating a test library and related devices. Background technique [0002] In the software development process, it is necessary to perform automated testing on the functions of some programs; and in the prior art, when performing automated testing of certain functions, it is necessary to back up the tested data, and when the test is completed, use The backup file restores the data after the test to ensure that the original data model remains unchanged, so that the original data can be used for repeated automated testing and verification. [0003] In the prior art, when performing data backup, the data in the entire database is backed up; and, in many cases, many test cases need to use the original data for testing during operation, therefore, As a result, every time a test case is run, the original data in the entire database needs to be resto...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/30G06F11/14
Inventor 李娟
Owner 深圳市金蝶精斗云网络科技有限公司
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