Measurement method of X-ray micro-zone absorption fine structure with spatial resolving capability

Abstract

The invention provides a measurement method of an X-ray micro-zone absorption fine structure with spatial resolving capability. The measurement method is characterized by comprising the following steps: generating X-ray monochromatic light with preset energy; recording intensity information of the X-ray monochromatic light; and collecting the X-ray monochromatic light by an imaging detector with multiple pixel cells after the X-ray monochromatic light passes through a sample, thereby obtaining information of the absorption fine structure of the sample under the preset energy. According to the method, the X-ray imaging detector is utilized to collect two-dimension projection data of the sample within a certain range of X-ray energy, and the information of the X-ray absorption fine structure of a sample zone represented by each pixel dot can be obtained respectively.

Description

technical field [0001] The invention relates to the technical fields of X-ray absorption spectrum and X-ray imaging, and particularly designs an X-ray absorption spectrum measurement method with spatial resolution capability. Background technique [0002] X-ray absorption spectrum (X Ray Absorption Fine Structure, XAFS) represents the change curve of the absorption coefficient μ of the sample and the X-ray energy E, which contains rich structural information of the sample. By properly analyzing the X-ray absorption spectrum, information about the geometric structure and electronic structure of the sample can be obtained. Therefore, X-ray absorption spectroscopy has important application prospects and application values ​​in many scientific fields such as chemistry, biology, materials, environment, and geology, and has become a structure determination tool welcomed by scientists in various disciplines. [0003] So far, most of the current XAFS experiments are carried out on ...

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Problems solved by technology

[0008] The above data acquisition methods are very time-consuming, and the accuracy of data acquisition is easily affected by factors such as the accuracy of sample movement and the stability of the incident X-ray light source, and the manufacturing cost of optical components such as focusing mirrors is expensive, which is not conducive to the promotion of X-ray absorption spectroscopy technology and limits The application of X-ray absorption spectroscopy technology in materials science and other fields

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