Measurement method of X-ray micro-zone absorption fine structure with spatial resolving capability

A measurement method and spatially resolved technology, which is applied in the fields of X-ray absorption spectroscopy and X-ray imaging, can solve the problems of limiting X-ray application, unfavorable X-ray promotion, and high manufacturing cost.

Active Publication Date: 2014-10-29
INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI
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Problems solved by technology

[0008] The above data acquisition methods are very time-consuming, and the accuracy of data acquisition is easily affected by factors such as the accuracy of sample movement and the stability of the incident X-ray light source, and the manufacturing cost of optical components such as focusing mirrors is expensive, which is not conducive to the promotion of X-ray absorption spectroscopy technology and limits The application of X-ray absorption spectroscopy technology in materials science and other fields

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  • Measurement method of X-ray micro-zone absorption fine structure with spatial resolving capability
  • Measurement method of X-ray micro-zone absorption fine structure with spatial resolving capability
  • Measurement method of X-ray micro-zone absorption fine structure with spatial resolving capability

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[0030] Embodiments will now be described more fully with reference to the accompanying drawings. Embodiments may, however, be embodied in many forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the concept of the embodiments to this present invention. technical personnel in the field.

[0031] Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of embodiments of the invention. However, one skilled in the art will appreciate that the technical solutions of the present invention may be practiced without one or more of the specific details, or that other methods, components, materials, etc. may be employed. In other instances, well-known struc...

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Abstract

The invention provides a measurement method of an X-ray micro-zone absorption fine structure with spatial resolving capability. The measurement method is characterized by comprising the following steps: generating X-ray monochromatic light with preset energy; recording intensity information of the X-ray monochromatic light; and collecting the X-ray monochromatic light by an imaging detector with multiple pixel cells after the X-ray monochromatic light passes through a sample, thereby obtaining information of the absorption fine structure of the sample under the preset energy. According to the method, the X-ray imaging detector is utilized to collect two-dimension projection data of the sample within a certain range of X-ray energy, and the information of the X-ray absorption fine structure of a sample zone represented by each pixel dot can be obtained respectively.

Description

technical field [0001] The invention relates to the technical fields of X-ray absorption spectrum and X-ray imaging, and particularly designs an X-ray absorption spectrum measurement method with spatial resolution capability. Background technique [0002] X-ray absorption spectrum (X Ray Absorption Fine Structure, XAFS) represents the change curve of the absorption coefficient μ of the sample and the X-ray energy E, which contains rich structural information of the sample. By properly analyzing the X-ray absorption spectrum, information about the geometric structure and electronic structure of the sample can be obtained. Therefore, X-ray absorption spectroscopy has important application prospects and application values ​​in many scientific fields such as chemistry, biology, materials, environment, and geology, and has become a structure determination tool welcomed by scientists in various disciplines. [0003] So far, most of the current XAFS experiments are carried out on ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/083
Inventor 张凯吴雪卉朱佩平袁清习黄万霞
Owner INST OF HIGH ENERGY PHYSICS CHINESE ACAD OF SCI
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