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Rapid measurement method of LED light distribution curve

A light distribution curve and measurement method technology, applied in the field of applied optics, can solve the problems of complex test equipment, poor test timeliness, and long test time, and achieve the effects of saving measurement steps, shortening measurement time, and strong operability

Inactive Publication Date: 2015-10-14
SUN YAT SEN UNIV
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  • Abstract
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  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In order to solve the problems of long test time of traditional LED light distribution curve, complex test device and poor test timeliness, the present invention proposes a fast measurement method for LED light distribution curve

Method used

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  • Rapid measurement method of LED light distribution curve
  • Rapid measurement method of LED light distribution curve
  • Rapid measurement method of LED light distribution curve

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Embodiment

[0029] Such as figure 1 Shown is a schematic top view of a preferred embodiment provided by the present invention, including LED lamp 1, a cylindrical translucent receiving screen 2 with a bottom radius of 10 cm, a coaxially placed CCD camera 3 and a computer 4 connected to the CCD camera.

[0030] Such as image 3 As shown, a kind of LED light distribution curve fast measurement method provided by the present invention comprises the following steps:

[0031] S1. Calibrate the pixel coordinates of the image formed by the CCD camera and the spatial coordinates of the light spot intensity on the LED receiving screen to realize the one-to-one mapping between the LED luminous intensity and the light emission angle. Design a cylindrical translucent receiving screen with a bottom radius of 10cm. The luminous center of the LED is on the axis perpendicular to the bottom of the cylindrical receiving screen. They are all 10cm, choose a calibration tape with a length of 31.4cm and 36 e...

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Abstract

The invention discloses a rapid measurement method of an LED light distribution curve. The method comprises the following steps that: (1), a pixel coordinate of an image formed by an image sensor and an LED luminous intensity space coordinate are calibrated, thereby realizing one-to-one mapping of LED luminous intensities and exit angles; (2), the image sensor shoots an LED light spot image formed on a receiving screen and a non-LED-light-spot receiving screen background image and a computer reads the images to light distribution curve measurement software; (3), image subtraction is carried out to deduct background interference information; (4), Gamma correction is carried out on images with background deduction; (5), gravity center marking is carried out on the images after Gamma correction; (6), pixel point gray values of horizontal bands where the image gravity centers are located are extracted; (7), light intensity correction is carried out; (8), a light distribution curve is drawn automatically according to a light intensity correction formula obtained by the step (7). The method has advantages of high operability, fast measurement speed, high environmental adaptation, and visual measurement result.

Description

technical field [0001] The invention relates to the field of applied optics, in particular to a method for quickly measuring LED light distribution curves. Background technique [0002] Semiconductor light-emitting diode (LED) is an important optoelectronic device. Its light-emitting principle is very different from traditional lighting such as incandescent lamps and fluorescent lamps, and its optical characteristics are also different. This requires corresponding adjustments to the measurement methods of LED photoelectric characteristics. [0003] At present, the measurement of LED radiation engineering quantities, such as luminous flux and color temperature measurement, can be realized quickly. As an important parameter reflecting the light intensity distribution of lamps, the light distribution curve is an important basis for guiding lighting design and lamp selection. The measurement takes a long time. There has never been a quick way to measure it. [0004] There are t...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02G01J1/00
Inventor 蔡志岗马鸿键林燕玲王嘉辉李佼洋王福娟
Owner SUN YAT SEN UNIV
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