A switch switching device for td-lte/td-lte-advanced base station radio frequency conformance test system
A test system and consistency technology, applied in the direction of wireless communication, electrical components, etc., can solve problems such as complex connection, long test time, and complicated test process, and achieve high accuracy and meet the effect of calibration
Active Publication Date: 2020-12-01
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology
[0003] The traditional base station radio frequency conformance test is to manually connect related test instruments through cables, power dividers, attenuators, etc. for different test cases, which will cause the shortcomings of complicated test process, long test time, and low test efficiency. The connection is too complicated to ensure that the frequency response and channel gain of the entire measurement channel are well calibrated and compensated, so it is imminent to develop a switching device for TD-LTE / LTE-Advanced base station RF conformance test system
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[0026] As shown in the figure, a TD-LTE / LTE-Advanced base station radio frequency conformance test system switching device includes double-pole double-throw switches K2-1-K2-5, K3-1-K3-6, single-pole double-throw switches K2-7, K2-8, K3-7, double pole single throw switch K2-6, K2-9, single pole three throw switch K3-9; one input end of double pole double throw switch K2-1 is connected with base station antenna 1 Connection, one input end of double pole double throw switch K3-1 is connected with base station antenna 2, one input end of double pole double throw switch K3-2 is connected with base station antenna 3, one input end of double pole double throw switch K3-3 Connect with base station antenna 4, one input terminal of double pole double throw switch K3-4 is connected with base station antenna 5, one input terminal of double pole double throw switch K3-5 is connected with base station antenna 6, double pole double throw switch K3-6 One input end of the DPDT is connected to...
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The invention discloses a switching device for a TD-LTE / TD-LTE-Advanced base station radio frequency conformance testing system, which comprises multiple double-pole-double-throw switches, multiple single-pole-double-throw switches, multiple double-pole-single-throw switches, and a single-pole-three-throw switch K3-9. Different switch connection paths are controlled via software; according to requirements of the TD-LTE / TD-LTE-Advanced base station radio frequency conformance testing device, multiple switches are combined and controlled to be switched according to demands of different test cases of the base station, quick scheduling of multiple instruments of the TD-LTE / TD-LTE-Advanced base station radio frequency conformance testing system can be met, cooperative work of the multiple instruments can be met, and the radio frequency design index can be ensured to meet 3GPP-related base station radio frequency conformance requirements.
Description
technical field [0001] The invention relates to the application field of TD-LTE base station radio frequency conformance testing, in particular to a switching device for a TD-LTE / TD-LTE-Advanced base station radio frequency conformance testing system. Background technique [0002] With the large-scale construction of TD-LTE network and the advancement of TD-LTE-Advanced technology, as a key part of pre-network testing and verification, the base station radio frequency conformance test system plays a very critical role. 3GPP TS36.141 defines all radio frequency conformance test cases for the base station network access test, and requires accurate testing of each test case for the base station, which requires testing instruments with different functions to test it. For the development and production testing of the base station In the process of testing, how to schedule so many test instruments, how to avoid frequent and complicated connection of test cables for different test ...
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IPC IPC(8): H04W24/02
CPCH04W24/02
Inventor 徐波凌云志黄武
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP