LVDT sensor signal detection circuit and detection method thereof

Abstract

The invention discloses an LVDT sensor signal detection circuit and a detection method thereof. The detection circuit comprises a frequency generation circuit. The frequency generation circuit is connected with an LVDT sensor sequentially through an analog filter circuit and a drive circuit. A secondary coil of the LVDT sensor is connected with an envelope analysis module and a fault judgement module sequentially through an amplitude processing circuit and an A / D conversion module. The detection method comprises the steps that a primary coil outputs sine 0 phase; after delay, the phase of the secondary coil is judged; the duration of 0 phase of the secondary coil is recorded; according to recorded delay data, the secondary coil of the LVDT sensor carries out signal acquisition; whether signal amplitude, phase and acceleration are within a normal range is judged through the envelope analysis module and the fault judgement module; and failures are detected corresponding to different situations. According to the invention, detection and failure diagnosis are integrated into a whole body, and diagnostic coverage and flexibility are high.

Description

technical field [0001] The invention belongs to the field of industrial control, and in particular relates to an LVDT sensor signal detection circuit and a detection method thereof. Background technique [0002] LVDT linear variable differential transformer is a common displacement sensor in industrial control systems, widely used in electric power, petrochemical, chemical and other industries. The problems existing in the existing LVDT sensor signal detection technology are as follows: [0003] 1. All current methods use analog methods, with complex circuits, low integration, low reliability, and difficult to reduce costs. [0004] 2. The current method cannot completely detect faults of LVDT signals, such as primary coil faults, circuit faults, etc. The reason is that the previous scheme uses analog to extract information, which cannot fully analyze the original signal, but only extracts useful information, while fault detection needs to use part of the information filte...

AI Technical Summary

Problems solved by technology

[0003] 1. All current methods use analog methods, with complex circuits, low integration, low reliability, and difficult cost reduction

[0004] 2. The current method cannot completely detect faults of LVDT signals, such as primary coil faults, circuit faults, etc.

The reason is that the previous scheme uses analog to extract information, which cannot fully analyze the original signal, but only extracts useful information, and fault detection needs to use part of the information filtered out by analog acquisition information, so fault judgment cannot be performed

[0005] 3. Poor adaptability, because it is implemented through an analog circuit, so when the characteristics of the external sensor change, circuit parameters need to be adjusted

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