Radio-frequency amplifier intermodulation suppression level measurement method based on X-parameter

A radio frequency amplifier and intermodulation suppression technology, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc., can solve problems such as slow measurement speed, complicated experimental equipment and experimental requirements
CN106199239AActive Publication Date: 2016-12-07BEIHANG UNIV
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Patent Information

Authority / Receiving Office
CN Β· China
Current Assignee / Owner
BEIHANG UNIV
Publication Date
2016-12-07

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Abstract

The invention relates to a radio-frequency amplifier intermodulation suppression level measurement method based on an X-parameter. The method comprises the step that the target X parameter of a radio-frequency amplifier is measured, wherein the target X parameter is a target parameter set; for the target X parameter, the scattered wave variable of the radio-frequency amplifier is acquired; the mapping relation among an incident wave variable, the scattered wave variable and signal power is constructed; and the intermodulation suppression level of the radio-frequency amplifier is acquired according to the mapping relation. According to the invention, the measurement method is simpler and more convenient that an intermodulation suppression level measurement method in the existing GJB151B-2013 in the aspects of experimental equipment and experimental steps.
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Description

technical field

[0001] The invention belongs to the field of electromagnetic compatibility testing and relates to a method for measuring the intermodulation suppression level of radio frequency amplifiers based on X parameters. Background technique

[0002] The X parameter is developed on the basis of the S parameter, which is a superset of the S parameter. The basic physical meaning of the X parameter refers to the component in the frequency domain of the reference response generated by the reference stimulus signal equivalent to the test stimulus signal. The X parameter describes the nonlinear behavior of the DUT (Device Under Test, here refers to the amplifier) ​​in the form of nonlinear spectrum mapping. The X-parameters represent the basic characteristics of the DUT's steady-state nonlinear behavior, usually in the form of input-output. In the field of electromagnetic compatibility testing, the measurement of the intermodulation suppression level of the RF amplifier i...

Claims

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