Key durability test device and method
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- 广电计量检测(天津)有限公司
- Publication Date
- 2017-05-31
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Figure 1
Abstract
Description
technical field
[0001] The invention relates to the technical field of button testing, in particular to a button durability testing device and method. Background technique
[0002] At present, keys are widely used in various electronic devices, such as automobiles, computers, industrial controllers, etc., as components for controlling commands or data input. The quality of the key and whether it can be operated normally directly affect the work of the electronic device. In order to improve the reliability of the key and improve the quality of the electronic equipment, it is necessary to perform a durability test on the performance of the key. In the button durability test, according to the product needs and part of the test requirements, the durability action is alternately performed on multiple buttons. In the traditional test equipment, multiple keys are alternately tested for durability by means of multiple cylinders or motors, wherein one cylinder or motor controls one...