Testing system and testing method for induction cooker

Abstract

The invention relates to a testing system for an induction cooker. The system comprises a control unit, a human-computer interaction unit, a movement driving unit and a programmable power supply, wherein the human-computer interaction unit, the movement driving unit and the programmable power supply are electrically connected with the control unit; the control unit is also electrically connected with an induction cooker to be tested; the movement driving unit comprises a left movement control unit, a front and back movement control unit, a vertical movement control unit and a rotation controlunit, wherein the left movement control unit, the front and back movement control unit, the vertical movement control unit and the rotation control unit are independently and correspondingly used fordriving tested cookware to move and rotate on the induction cooker; and the programmable power supply is electrically connected with the power output end of the induction cooker for generating outputvoltage of a corresponding waveform according to the power supply editing command of the control unit. The invention also relates to a testing method for the induction cooker, and comprises a durability testing method for the induction cooker, and the durable working performance of the induction cooker when the tested cookware is under various states on the induction cooker can be tested. By use of the testing system and for the induction cooker, induction cooker performance testing can be comprehensively realized to improve testing efficiency and reduce testing cost.

Description

technical field [0001] The invention relates to a test system for an electromagnetic cooker, and also relates to a test method for an electromagnetic cooker. Background technique [0002] Induction cookers usually need to be tested during the production process so that they meet the design requirements. For example, the authorized announcement number is CN103605010B (application number is 201310461989.1) Chinese invention patent "Induction Cooker Energy Efficiency Automatic Test Device", wherein the disclosed test device can test the working energy efficiency of the electronic cooker when the pot is normally placed on the electromagnetic cooker, but the electromagnetic cooker During use, the pot will move, move away, tilt, etc., and the test device in this invention cannot realize the working status of the electromagnetic cooker under these conditions, so the energy efficiency test of the electromagnetic cooker is not comprehensive enough. Authorized announcement number is ...

AI Technical Summary

Problems solved by technology

For example, the authorized announcement number is CN103605010B (application number is 201310461989.1) Chinese invention patent "Induction Cooker Energy Efficiency Automatic Test Device", wherein the disclosed test device can test the working energy efficiency of the electronic cooker when the pot is normally placed on the electromagnetic cooker, but the electromagnetic cooker During use, the pot will move, move away, tilt, etc. The test device in this invention cannot realize the working status of the induction cooker under these conditions, so the energy efficiency test of the induction cooker is not comprehensive enough

Authorized announcement number is CN203630253U (application number is 201320865590.5) Chinese utility model patent "Induction cooker test device", the test device disclosed in it can not only realize the automatic pressing test of the button, but also realize the work of the induction cooker when the pot is moved and removed situation, but this device cannot realize the power test when the pan is in a tilted state and is in contact with the induction cooker

In addition, during the use of the induction cooker, the power supply for its power supply may be abnormal. There will be distortion. The current test device does not test whether the induction cooker can work normally in the harsh power supply environment, so the performance of the induction cooker in the harsh power supply environment cannot be guaranteed.

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