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Method for Ion Reaction and Analysis in Orbital Ion Trap

An ion reaction and ion trap technology, applied in the field of ion trap mass spectrometer, can solve the problems of low ion reaction efficiency, and achieve the effects of being conducive to miniaturization, overcoming loss and ensuring efficiency

Active Publication Date: 2019-11-26
SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV
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Problems solved by technology

[0003] Although the H-shaped array ion trap reactor can realize ion analysis and ion reaction, due to the limitation of the rectangular ion trap itself, that is, the existence of ion gates, the two kinds of ions to be reacted can only partially enter the middle for ion reaction. In the trap, the ion reaction efficiency is low

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  • Method for Ion Reaction and Analysis in Orbital Ion Trap
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  • Method for Ion Reaction and Analysis in Orbital Ion Trap

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Embodiment Construction

[0015] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.

[0016] The specific embodiment of the present invention provides a method for performing ion reaction and analysis in an orbital ion trap, referring to figure 1 and figure 2 , the orbital ion trap comprises a first sub-ion trap 10 and a second sub-ion trap 20 which are jointly surrounded by a ring, and the first sub-ion trap 10 comprises a first rectangular orbit 13 and is located on the first rectangular orbit. Two fan-shaped tracks 11, 12 at both ends of 13, the second sub-ion trap 20 includes a second rectangular track 23 and two fan-shaped tracks 21, 22 located at two ends of the second rectangular track 23; the first and second sub-ion traps The ion traps 10 and 20 are respectively used to bind two kinds of ions to be reacted; the two kinds of ions to be reacted can be both positive ions or negative ions, or the positive ions can react w...

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Abstract

The invention discloses a method for ion reaction and analysis in an orbital ion trap. The orbital ion trap comprises a first sub-ion trap and a second sub-ion trap which are enclosed into a ring in common, wherein the first sub-ion trap comprises a first rectangular orbit and two fan-shaped orbits located at two ends of the first rectangular orbit; the second sub-ion trap comprises a second rectangular orbit and two fan-shaped orbits located at two ends of the second rectangular orbit; and the first sub-ion trap and the second sub-ion trap are used for binding two ions for reaction separately. The method comprises the steps as follows: the two ions for reaction are bound into the first sub-ion trap and the second sub-ion trap separately, and ion gates of the fan-shaped orbits at two endsof the first sub-ion trap and the second sub-ion trap are controlled to be opened, so that the two ions bound into the first sub-ion trap and the second sub-ion trap collide for reaction in a vacuum condition; and after ion reaction lasts for preset time, the orbital ion trap is controlled to enter an ion analysis stage and ion reaction products are excited out of the orbital ion trap.

Description

technical field [0001] The invention relates to the field of ion trap mass spectrometers, in particular to a method for performing ion reaction and analysis in a miniaturized orbital ion trap. Background technique [0002] A mass spectrometer is an instrument that determines a substance by qualitatively and quantitatively measuring its charge-to-mass ratio. The ion trap is one of the core components of the ion trap mass spectrometer. The ion trap separates the ions according to their charge-to-mass ratio and sends them to the ion detector in sequence. [0003] Although the H-shaped array ion trap reactor can realize ion analysis and ion reaction, due to the limitation of the rectangular ion trap itself, that is, the existence of ion gates, the two kinds of ions to be reacted can only partially enter the middle for ion reaction. In the trap, the ion reaction efficiency is low. [0004] The disclosure of the above background technical content is only used to assist in unders...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/06H01J49/26
CPCH01J49/063H01J49/26
Inventor 余泉李曼王晓浩倪凯钱翔
Owner SHENZHEN GRADUATE SCHOOL TSINGHUA UNIV
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