Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Universal serial bus line concentration device and universal serial bus line concentration equipment

A universal serial bus and hub device technology, applied in the storage field, can solve the problems of low universal serial bus test efficiency, test speed limit, etc.

Pending Publication Date: 2019-12-31
SHENZHEN DEMINGLI ELECTRONICS
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The existing universal serial bus line scheme, when testing, is generally one to sixteen 2.0 hubs or 3.0 hubs with an interface bandwidth of only 40 megabits, and the test speed is limited by the interface bandwidth, resulting in the test of the universal serial bus. Low test efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Universal serial bus line concentration device and universal serial bus line concentration equipment
  • Universal serial bus line concentration device and universal serial bus line concentration equipment
  • Universal serial bus line concentration device and universal serial bus line concentration equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0049]The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments. In particular, the following examples are only used to illustrate the present invention, but not to limit the scope of the present invention. Likewise, the following embodiments are only some but not all embodiments of the present invention, and all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0050] The invention provides a universal serial bus line collection device, which can improve the test efficiency of testing the universal serial bus.

[0051] See figure 1 , figure 1 It is a structural schematic diagram of an embodiment of the universal serial bus hub device of the present invention. In this embodiment, the USB hub device 10 includes a hub 11 and a microcontroller 12 .

[0052] The hub 11 is connected with the microcontroller 12...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a universal serial bus line concentration device and universal serial bus line concentration equipment. The universal serial bus line concentration device comprises a concentrator and a singlechip, wherein the concentrator is connected with the single-chip, and the single-chip can control a power supply of a lower connection port of the universal serial bus and a power supply of a main controller of the concentrator, can test current and voltage of fifteen ports of the universal serial bus and can test direct current input voltage of the universal serial bus. By means of the mode, the speed of the interface bandwidth can be increased by adopting a four-to-sixteen interface bandwidth mode, and the test efficiency of testing the universal serial bus can be improved bymeans of the increased speed of the interface bandwidth.

Description

technical field [0001] The invention relates to the technical field of storage, in particular to a universal serial bus hub device and a universal serial bus hub device. Background technique [0002] In the manufacturing process of storage disk memory card, there will be many test procedures using PC (personal computer, computer). One of the test procedures is to write data to the storage disk memory card through the computer PC and then read it out for verification. This test Process Basically every removable storage disk or memory card needs to be tested. [0003] Commonly used hub solutions on the market for testing are generally 2.0 HUBs (hubs) with one to sixteen interfaces. The interface bandwidth is only 40MB (MByte, megabytes). The interface bandwidth on the host is also 40MB+500MB, because the internal junction of the USB (Universal Serial Bus, Universal Serial Bus) 3.0 hub HUB is the bandwidth of Universal Serial Bus USB 2.0 devices, and the bandwidth of Universal...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22G06F13/40G06F13/42G11C29/56
CPCG06F11/221G06F13/4068G06F13/4282G11C29/56
Inventor 李虎何勇
Owner SHENZHEN DEMINGLI ELECTRONICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com