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A Method for Measuring Magnetic Variables Based on Intelligent Sensing

A measurement method and intelligent sensing technology, applied in the field of magnetic variable measurement, can solve problems such as difficult to make early warning and difficult to accurately determine the production requirements of magnetic chips

Active Publication Date: 2020-11-24
JIANGXI UNIV OF TECH
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

[0003] However, when the magnetic chip is measured by the existing method, it is difficult to accurately judge whether the magnetic chip meets the production requirements, and when it does not meet the standard, it is difficult to make a corresponding early warning

Method used

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Examples

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Effect test

Embodiment Construction

[0020] In an embodiment of the present invention, a method for measuring magnetic variables based on intelligent sensing includes the following steps:

[0021] S1: Record the magnetic detection data on three different types of magnetic chips, and obtain standard data 1, standard data 2 and standard data 3;

[0022] S2: When the sensor 1 detects that the magnetic chip is approaching, use the sensor 2 to delay the entry time of the magnetic chip, and record the magnetic detection raw data after the magnetic chip reaches the designated position;

[0023] S3: Filtering the raw magnetic detection data obtained in S2, then performing shunt processing on the filtered raw magnetic detection data, and performing AD conversion on the shunted raw magnetic detection data to obtain converted data;

[0024] S4: Compare the conversion data obtained in S3 with the standard data 1, standard data 2, and standard data 3 obtained in S1, and judge whether the detection result is an abnormal magnet...

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Abstract

The invention relates to the technical field of magnetic variable measurement, and discloses a magnetic variable measurement method based on intelligent sensing, and the method comprises the followingsteps: S1, recording magnetic detection data of three different types of magnetic chips, and obtaining standard data I, standard data II and standard data III; and S2, when a sensor I detects that amagnetic chip approaches, delaying the entering time of the magnetic chip by using a sensor II, and recording magnetic detection original data after the magnetic chip reaches a specified position. According to the invention, magnetic detection original data on the magnetic chip is obtained through an intelligent sensing mode; the magnetic detection original data is converted to obtain converted data; the detection result is judged to be an abnormal magnetic value through the magnetic signal variable quantity after the conversion data is compared with the standard data, when the detection result is abnormal, early warning can be rapidly given, a worker can easily know whether defective goods appear or not in time, and certain market popularization prospects are achieved.

Description

technical field [0001] The invention relates to the technical field of magnetic variable measurement, in particular to a magnetic variable measurement method based on intelligent sensing. Background technique [0002] The existing magnetic chips are mainly based on the three types of Hall effect, giant magnetoresistance effect and magnetic tunnel junction effect. The magnetic properties of the magnetic chip directly determine the application field and scope of the magnetic sensor. Therefore, the magnetic properties of the chip must be checked before leaving the factory. Tests can be made to determine whether the technical requirements are met. [0003] However, when the magnetic chip is measured by the existing method, it is difficult to accurately judge whether the magnetic chip meets the production requirements, and when it does not meet the standard, it is also difficult to make a corresponding early warning. Therefore, those skilled in the art provide a method for measu...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R35/00G01D18/00
CPCG01D18/008G01R35/007
Inventor 戴仁村
Owner JIANGXI UNIV OF TECH
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