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RFID reader-writer sensitivity testing device and method based on multipath fading channel scene

A multi-path fading channel and sensitivity testing technology, which is applied in the field of RFID readers, can solve problems such as the inability to evaluate the actual communication performance of RFID readers

Active Publication Date: 2020-12-29
江苏省质量和标准化研究院
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AI Technical Summary

Problems solved by technology

The complexity and variety of actual wireless electromagnetic environment factors pose great challenges to the testing of RFID products
[0003] After analysis, it is found that there are the following problems in the existing RFID reader test technology: the current test of the signal in the RFID communication link based on the electromagnetic shielding environment without external interference cannot test the performance of the RFID reader under the multipath fading scenario. Comprehensive evaluation of actual communication performance

Method used

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  • RFID reader-writer sensitivity testing device and method based on multipath fading channel scene
  • RFID reader-writer sensitivity testing device and method based on multipath fading channel scene
  • RFID reader-writer sensitivity testing device and method based on multipath fading channel scene

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Embodiment

[0084] Step 1. Follow the Figure 1-Figure 3 Build a RFID reader sensitivity test system for multi-path fading channel scenarios, in which the RF operating frequency of the power amplifier is 50-1000MHz, and the power gain is 35dB. The power capacity of the forward and reverse attenuators is 40W, and the nominal attenuation is 35dB; the reference tag is a UHF RFID tag with a working frequency range of 800-1000MHz. The time delay processing unit in the multipath fading channel simulation module can simultaneously obtain the time delays of five non-direct paths by means of a shift register. The nominal attenuation of the forward attenuator and reverse attenuator in the RFID reader sensitivity test module is adjustable within the range of 0-35dB.

[0085] Step 2. Configure the subcarrier frequency f in the RFID reader under test l , generate the direct path signal and send it to the multipath fading channel simulation module.

[0086] The working frequency of the RFID reader i...

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Abstract

The invention discloses an RFID reader-writer sensitivity testing device and method based on a multipath fading channel scene, and the method comprises the steps of processing a direct path signal transmitted by a tested RFID reader-writer so as to generate an RFID multipath fading signal, adjusting the forward attenuation value of the RFID multipath fading signal until the tested RFID reader-writer can just read the critical state of the reference tag, and recording the power value of the reflection signal at the moment; adjusting the reverse attenuation value of the reflection signal until the measured RFID reader-writer cannot read that the reference tag reaches the critical state, and recording the reverse attenuation value at the moment; and subtracting the reverse attenuation value from the power value of the reflected signal to obtain the minimum receiving sensitivity of the tested RFID reader-writer. According to the invention, the actual application scene is simulated by usingthe multipath fading channel scene, and the sensitivity of the RFID reader-writer in the actual application scene is measured and obtained.

Description

technical field [0001] The invention relates to the technical field of RFID readers, in particular to an RFID reader sensitivity test device based on a multipath fading channel scenario, and also relates to a method for measuring the sensitivity of an RFID reader based on a multipath fading channel scenario. Background technique [0002] In the actual environment, the signals in the RFID communication link not only include direct wave signals, but also include indirect wave signals such as specular reflection signals and diffuse scattering signals that are reflected by surrounding objects. The non-direct wave signal will interfere with the direct wave signal, so that the observed value of the RFID reader deviates from the true value, resulting in the so-called "multipath error". The complexity and variety of actual wireless electromagnetic environment factors pose great challenges to the testing of RFID products. [0003] After analysis, it is found that there are the follo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K7/00
CPCG06K7/0095
Inventor 黄钰王瑜章学周俞晓磊李翔胡冶
Owner 江苏省质量和标准化研究院
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