Contrast data test method and device applied to contrast test system

Abstract

The invention discloses a contrast data test method and device applied to a contrast test system, and the method comprises the steps: achieving configuration of a plurality of types of inspection models through the interaction of all modules in a contrast test, selecting corresponding test data, and inputting the test data into a related model, so as to obtain a test result; the multi-model configuration process can be well applied to various scenes so as to meet the inspection requirements in different scenes, and the expansibility and the flexibility of the inspection process are improved. The method specifically comprises the steps of obtaining configuration information of a first inspection model, if a second inspection model waits for operation, generating comparison information according to the configuration information of the first inspection model and the configuration information of the second inspection model, and accessing the comparison information through a target interface, so that an index calculation module in the contrast test system generates a corresponding calculation thread; and calculating the second inspection model according to the calculation thread.

Description

technical field [0001] The present application relates to the field of computer technology, in particular to a control data testing method and device used in a control testing system. Background technique [0002] When designing and operating terminal applications (applications, APPs), experimenters will have a lot of intuitive ideas, guessing that certain designs and strategies may be better and more in line with user needs. But how to verify the conjecture needs to be proved by data. Generally, the AB test can be used to discover the differences in the indicators of different strategies in the experimental group and measure whether these differences are statistically significant. For example, there are thousands of indicators in WeChat's AB testing system, and how to conveniently apply appropriate statistical testing methods to these indicators has become a difficult problem. [0003] Usually, in the AB test system, a fixed inspection model is configured to provide inspe...

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Problems solved by technology

[0004] In the AB test, in order to ensure the accuracy of the test, multi-indicator and multi-dimensional analysis is generally used, that is, it is necessary to configure multiple inspection models for relevant indicators to meet the test requirements, and each indicator is manually analyzed and the relevant inspection model is added. The method will generate a lot of configuration work, greatly affecting the efficiency of the test

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