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High radiation dose measurement method and system

A dose measurement and high radiation technology, applied in the field of high radiation dose measurement methods and systems, can solve the problems of long acquisition time of dose data, complicated data acquisition steps, inaccurate reading of dose values, etc.

Active Publication Date: 2022-07-26
SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI
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Problems solved by technology

[0005] For this reason, the technical problem to be solved by the present invention is to overcome the problems of long dose data acquisition time, complicated data acquisition steps and inaccurate reading of dose values ​​in the radiation dosimetry method in the prior art.

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  • High radiation dose measurement method and system
  • High radiation dose measurement method and system

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Embodiment Construction

[0047] The present invention will be further described below with reference to the accompanying drawings and specific embodiments, so that those skilled in the art can better understand the present invention and implement it, but the embodiments are not intended to limit the present invention.

[0048]The Th-SINAP series crystal materials mentioned in the present invention will produce radiation photofluorescence changes after being irradiated by ultraviolet rays, X rays, γ rays and β rays, and the irradiated crystal materials will produce obvious and visible fluorescence under the excitation of ultraviolet rays. , the color of the fluorescence will change with the dose absorbed by the crystal material, and the green component of the fluorescence will be significantly enhanced with the increase of the absorbed dose, and the fluorescence component is linearly related to the absorbed dose. Therefore, an embodiment of the present invention provides a high radiation dose measuremen...

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Abstract

The invention relates to a high radiation dose measurement method and system. The method comprises: after receiving a reading instruction, collecting visible fluorescence data generated by a Th-SINAP crystal dose tablet excited by ultraviolet rays; screening and eliminating visible fluorescence data by using ultraviolet rays as excitation For the part affected by the light source, the actual visible fluorescence data is obtained; according to the actual visible fluorescence data, the corresponding dose value is read on the relationship curve between the visible fluorescence data and the dose determined by the calibration experiment, and the real-time dose rate is calculated. The invention uses ultraviolet to excite fluorescence and measures the radiation dose by collecting the fluorescence color. By eliminating the part of the visible fluorescence data that is affected by using ultraviolet as the excitation light source, it solves the problem of measuring high radiation dose (Gy / h-MGy / h amount in the traditional technology) The problems of long acquisition time of dose data, complicated data acquisition steps and inaccurate reading of dose values ​​existed in the case of high level).

Description

technical field [0001] The invention relates to the technical field of radiation dose detection, in particular to a high radiation dose measurement method and system. Background technique [0002] The field of nuclear science and technology in my country is developing rapidly. Radioisotopes and related irradiation devices and technologies are widely used in industry, agriculture, medical and health care, geological survey and other fields. The determination of ionizing radiation dose is used in irradiation sterilization, nuclear medicine, and high radioactive waste. Monitoring and other application scenarios play a very important role. [0003] At present, the main methods for measuring radiation dose are: 1). Use thermoluminescent dose tablets to read out the radiation dose value based on the principle of thermoluminescence; 2) Use the radiation discoloration indicator label to determine the radiation dose value according to the color of the label after irradiation; 3). Use...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01T1/10G01T7/00
CPCG01T1/10G01T7/005
Inventor 戴志敏侯会良林健陆黄杰黄跃峰王建强钱渊
Owner SHANGHAI INST OF APPLIED PHYSICS - CHINESE ACAD OF SCI
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