Method for realizing coverage rate collection code reuse and computer readable medium
A code reuse and coverage technology, applied to methods and computer-readable media to realize coverage collection code reuse, can solve problems such as easy omission, error, trouble, etc., to reduce system complexity, facilitate maintenance, and simplify chip verification methods Effect
Pending Publication Date: 2022-05-06
杭州云合智网技术有限公司
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Problems solved by technology
[0025] In this regard, although only some ignore_bins need to be added, the previous coverage collection code needs to be completely copied. Similarly, if there are other chips of the same type with other performance, there will be a lot of duplicate code, and multiple codes need to be maintained at the same time. sets almost the same coverage collection code as
In addition, if you need to modify it later, you may need to modify multiple places synchronously, which is troublesome and easy to miss and make mistakes
Method used
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[0042] The preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, and the present invention will be further elaborated.
[0043] First, combine the Figure 2~3 The method for implementing coverage collection code reuse according to the embodiment of the present invention is described, which is used for chip verification with different performances and different modes, and its application scenarios are very wide.
[0044] like Figure 2~3 As shown, the method for implementing coverage collection code reuse in the embodiment of the present invention has the following steps:
[0045] Specifically, such as Figure 2~3 As shown, in step S1, the base class cg_ignore_bins_default is created to be derived in subsequent steps. In this embodiment, the function of the base class covered with the keyword virtual is added to realize abstraction, so that its subclasses can Function methods are overloaded.
[0046] ...
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The invention discloses a method for realizing coverage rate collection code reuse. The method comprises the following steps: creating a coverage bin base class; according to needs, the covering bin base class derives a covering bin subclass, and a function of the covering bin base class is reloaded; a coverage rate collection object is created, the coverage rate collection object comprises a static array variable declaring the state, and the static array variable is used for obtaining coverage rate collection needing to be ignored; declaring and instantiating a coverage rate collection object for creating a test case; and in the test case, reloading the class object actually required in the coverage bin base class used by default in the test case for reusing the coverage rate to collect codes. The system complexity of a chip verification platform is reduced, the whole chip verification method is more concise, meanwhile, coverage collection of some performance characteristics which are not supported any more is ignored by directly reloading a coverage collection component object needed by a project, the reloading process is more visual and convenient to understand, and later maintenance of verification environment codes is facilitated.
Description
technical field [0001] The invention relates to the technical field of chip verification, in particular to a method for realizing coverage collection code reuse and a computer-readable medium. Background technique [0002] like figure 1 Shown is an example diagram after abstracting the functional logic of a chip. [0003] Each port signal is as follows: [0004] op: operation instruction, including addition ADD, subtraction SUB, multiplication MUL, division DIV operation; [0005] A: operation operand, use the register bank to calculate and store the operand; B: calculation operand, use the register bank to calculate and store the operand; rslt: operation result, use the register bank to calculate and store the result. [0006] Usually, in order to meet different market needs, different product strategies will be formulated, and corresponding product planning will be carried out, and a variety of chips of the same type with different performances will be planned. Then the...
Claims
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IPC IPC(8): G06F8/36G06F8/30G06F11/36
CPCG06F8/36G06F8/315G06F11/3676G06F11/3684
Inventor马骁
Owner杭州云合智网技术有限公司