Capacitor electric leakage detection method, device and equipment of storage unit array and medium

A storage cell array and storage capacitor technology, applied in the storage field, can solve problems such as the inability to finely detect capacitor leakage behavior

Pending Publication Date: 2022-07-22
CHANGXIN MEMORY TECH INC
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The present application provides a capacitance leakage detection method, device, equipment and medium of a memory cell array, which overcomes the problem that the capacitance leakage behavior cannot be finely detected in the related art at least to a certain extent

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  • Capacitor electric leakage detection method, device and equipment of storage unit array and medium
  • Capacitor electric leakage detection method, device and equipment of storage unit array and medium
  • Capacitor electric leakage detection method, device and equipment of storage unit array and medium

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Embodiment Construction

[0051] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments, however, can be embodied in various forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this application will be thorough and complete, and will fully convey the concept of example embodiments to those skilled in the art. The described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

[0052] Furthermore, the drawings are merely schematic illustrations of the present application and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and thus their repeated descriptions will be omitted. Some of the block diagrams shown in the figures are functional entities that do not necessarily necessarily correspond to physically or logically separate entities. These func...

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Abstract

The invention provides a capacitor electric leakage detection method and device, equipment and a medium, and relates to the technical field of storage. The method comprises the steps that first change correlation information of capacitance retention time of a to-be-detected storage capacitor and word line voltage of a to-be-detected word line is obtained, the word line voltage of the to-be-detected word line changes in a preset voltage range including word line closing voltage, and when the first change correlation information meets a first anomaly judgment condition, the to-be-detected storage capacitor is detected according to the first anomaly judgment condition; determining that the electric leakage behavior of the to-be-detected storage capacitor is related to the to-be-detected word line; or second change correlation information of capacitance retention time of the to-be-detected storage capacitor and word line voltage of an adjacent word line is obtained, the word line voltage of the adjacent word line changes in a preset voltage range, and under the condition that the second change correlation information meets a second anomaly judgment condition, the to-be-detected storage capacitor is detected. And determining that the electric leakage behavior of the to-be-detected storage capacitor is related to the adjacent word line. According to the embodiment of the invention, fine detection of the electric leakage behavior of the capacitor can be realized.

Description

technical field [0001] The present application relates to the field of storage technologies, and in particular, to a method, device, device, and medium for detecting capacitance leakage of a memory cell array. Background technique [0002] In the field of storage technology, the leakage of the storage capacitor often affects the performance of the memory. Therefore, how to detect the leakage current of the capacitor has become an urgent problem to be solved. [0003] The current leakage detection technology of the storage capacitor can realize the rough detection of whether the storage capacitor has leakage, but cannot realize the fine detection of the specific leakage position of the leakage behavior of the storage capacitor. [0004] It should be noted that the information disclosed in the above Background section is only for enhancing understanding of the background of the application, and therefore may include information that does not form the prior art known to a pers...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/02G11C8/08G11C29/50G11C29/12
CPCG11C29/025G11C8/08G11C2029/5004G11C2029/1202
Inventor 杨龙
Owner CHANGXIN MEMORY TECH INC
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