Image registration method and defect detection method

A technology of image registration and defect detection, which is applied in the field of image processing and can solve the problems of low accuracy of image registration

Pending Publication Date: 2022-08-09
上海精积微半导体技术有限公司
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Problems solved by technology

In order to be able to compare and stitch these images, image registration is essential, but the accuracy of image registration in the prior art is low

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  • Image registration method and defect detection method
  • Image registration method and defect detection method
  • Image registration method and defect detection method

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Embodiment Construction

[0045] In order to make the purpose, technical solutions and advantages of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings of the present invention. Obviously, the described embodiments are a part of the present invention. examples, but not all examples. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention. Unless otherwise defined, technical or scientific terms used herein should have the ordinary meaning as understood by one of ordinary skill in the art to which this invention belongs. As used herein, "comprising" and similar words mean that the elements or things appearing before the word encompass the elements or things recited after the word and their equivalents, but do not excl...

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Abstract

The invention provides an image registration method and a defect detection method, and the method comprises the steps: carrying out the up-sampling inverse Fourier transform of a phase cross-correlation spectrum of an energy spectrum, so as to obtain a zoom factor and a rotation angle of a to-be-registered image relative to a reference image; transforming the image to be registered according to the zoom factor and the rotation angle, and calculating the translation amount of the image to be registered relative to the reference image based on the Fourier spectrum of the corresponding area of the transformed image to be registered and the Fourier spectrum of the corresponding area of the reference image, through up-sampling inverse Fourier transform, the precision of a scaling factor and a rotation angle in a registration process is remarkably improved, the precision of a translation amount is further improved, and the precision of image registration is improved.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to an image registration method and a defect detection method. Background technique [0002] Image registration refers to converting two or more images into the same coordinate system. The process of image registration is common in computer vision, medical imaging, remote sensing images, and military security. [0003] Two or more images may have been acquired at different times, different lighting, different viewing angles, different depths, different sensors, or even different devices. In order to be able to compare and stitch these images, image registration is essential, but the registration accuracy of images in the prior art is low. [0004] Therefore, it is necessary to provide a novel image registration method and defect detection method to solve the above problems existing in the prior art. SUMMARY OF THE INVENTION [0005] The purpose of the present invention ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/37G06T5/50G06T7/00
CPCG06T7/37G06T5/50G06T7/0002
Inventor 刘耀阳
Owner 上海精积微半导体技术有限公司
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