Method for measuring CdTe quantum point grain diameter by resonant vibration scattered spectrum

A technique of resonance scattering and spectrometry, applied in the field of characterization of CdTe quantum dots, achieves good application value and easy operation

Inactive Publication Date: 2010-05-19
GUANGXI NORMAL UNIV
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Problems solved by technology

However, there is no report on the characterization of the particle size of CdTe quantum dots by resonance scattering spectroscopy

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  • Method for measuring CdTe quantum point grain diameter by resonant vibration scattered spectrum
  • Method for measuring CdTe quantum point grain diameter by resonant vibration scattered spectrum
  • Method for measuring CdTe quantum point grain diameter by resonant vibration scattered spectrum

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Embodiment Construction

[0011] Below in conjunction with accompanying drawing and embodiment the present invention will be further described:

[0012] A method for measuring the particle size of CdTe quantum dots with resonance scattering spectroscopy, comprising the following steps:

[0013] (1) Pipette 1.0ml of 1.8×10 -3 mol L -1 CdTe solution in a 5.0ml graduated test tube, dilute to 2.0ml with sub-boiling high-purity water.

[0014] (2) pipette the solution in the quartz cell, place it on the fluorescence spectrophotometer, use Volt=500v, Ex. =λem), obtain the resonance synchronous scattering spectrum of CdTe quantum dots. Using λ=148.37ln(d)+418.08, the particle size of the CdTe quantum dots is obtained.

[0015] figure 1 , 2 It shows that: CdTe quantum dots with a particle size of 3.8nm have a resonant scattering peak at 597nm; and CdTe quantum dots with a particle size of 4.0nm have a resonant scattering peak at 622nm; The logarithm of the diameter has a good linear relationship (such a...

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Abstract

The invention discloses a method of using syntony scattered spectrum to test the grain diameter of CdTe quantum dot, which puts CdTe solution in a container with scale under normal temperature and uses second boiling high pure water to fix volume; putting the volume-fixed solution in quartz poor and laying on the fluorescence spectrometer, using the volt of 500v, the Ex.mono.Slit of 5.0nm to scanand arouse wavelength Lambada ex and projection wavelength Lambada em (Lambada ex=Lambada em) synchronously, and getting the syntony scattered spectrum of CdTe quantum dot; then using the linear relation between the syntony scattered wavelength and the grain diameter of the CdTe quantum dot to obtain the grain diameter of the CdTe quantum dot. The method in the invention has the advantages that: firstly, the operation is convenient, simple and quick, and the method just only needs to measure out the wavelength Lambada of syntony scattered peak of CdTe quantum dot, according to Lambada equalingto 148.371n (d0 added with 4.18.08 to get the grain diameter (d); secondly, the method has better application value.

Description

Technical field: [0001] The invention relates to a characterization method of CdTe quantum dots, in particular to a method for measuring the particle size of CdTe quantum dots by using resonance scattering spectroscopy. Background technique: [0002] Quantum Dots, also known as Semiconductor Nanocrystal, are a kind of luminescent nanoparticles. Compared with traditional organic fluorescent dyes, quantum dots have a wide excitation spectrum and continuous distribution, while the emission spectrum is symmetrically distributed, and Excellent optical properties such as narrow width, adjustable color, high photochemical stability, and difficult photolysis have been used in research fields such as light-emitting diodes and nano-lasers, and it is used as a fluorescent marker in medicine, clinical laboratory science, immunology, biology The potential application prospects in research fields such as science and technology have attracted widespread attention from the international sci...

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01N15/00G01N21/47
Inventor张声森王素梅蒋治良
OwnerGUANGXI NORMAL UNIV