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Heating temperature control method for device ageing screening

A device aging and heating temperature technology, which is applied in the direction of temperature control using electric methods, auxiliary controllers with auxiliary heating devices, instruments, etc., can solve the problems of slow speed and low efficiency, and achieve high efficiency and fast speed Effect

Inactive Publication Date: 2009-10-07
SHANGHAI ELECTRICAL AUTOMATION R&D INST
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] When performing aging screening on devices, ordinary heating either uses silicon controlled rectifiers, or uses contactor switching mode, only to control the temperature, which will lead to low efficiency and slow speed

Method used

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  • Heating temperature control method for device ageing screening
  • Heating temperature control method for device ageing screening
  • Heating temperature control method for device ageing screening

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Embodiment Construction

[0015] The present invention will be further described below in conjunction with accompanying drawing.

[0016] see figure 1 , the figure shows a device aging screening heating temperature control method of the present invention, comprising the following steps:

[0017] Step S1: Set the target temperature, that is, set the target temperature Ts required for device aging screening through a digital signal processor;

[0018] Step S2: Measure the ambient temperature, that is, measure the surrounding ambient temperature Tc, and then calculate the required adjustment temperature ΔT, ΔT=Ts-Tc;

[0019] Step S3: Calculate the heating power, that is, calculate the heating power W through the adjusted temperature ΔT calculated after detection, heating power W=K·ΔT 2 , where K is the conversion coefficient;

[0020] Step S4: The voltage trigger is given according to the heating power, that is, the voltage trigger is given according to the heating power W obtained in step S3 to trigg...

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PUM

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Abstract

The invention discloses a heating temperature control method in device ageing screening, which comprises the following steps setting target temperature, measuring ambient temperature, calculating heating power, providing voltage triggering according to the heating power, carrying out pulse width modulation (PWM) control according to the temperature so as to control the temperature. The invention not only controls the temperature on the basis of the common heating control method, but also additionally controls the power, thereby having high control efficiency and fast control speed.

Description

technical field [0001] The invention relates to a heating temperature control method, in particular to a device aging screening heating temperature control method. technical background [0002] When performing aging screening on devices, ordinary heating either uses thyristor rectification or contactor switching mode, and only aims at controlling temperature, which will lead to low efficiency and slow speed. How to improve efficiency and speed up is a problem to be solved urgently by the present invention. Contents of the invention [0003] The purpose of the present invention is to overcome the defects of the prior art, and provide a device aging screening heating temperature control method, which has the characteristics of high efficiency and fast speed. [0004] The technical solution for achieving the above purpose is: a device aging screening heating temperature control method, which includes the following steps: [0005] Step S1: Set the target temperature, that is...

Claims

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Application Information

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IPC IPC(8): G05D23/32G01R31/00G01R31/01
Inventor 陈冰李红词李新育朱蕴
Owner SHANGHAI ELECTRICAL AUTOMATION R&D INST
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