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58 results about "Device Age" patented technology
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A measure (or best estimate) of the length of time during which a device existed, measured from manufacture date (and time) to a given date (and time) of use. NOTE(S): Derived from the difference between the manufacture date and the date of the activity in which it is used. This is not really a characteristic of the device since the device could be used in multiple activities.
Electroluminescent device aging compensation with reference subpixels
ActiveUS20110074750A1Accurate agingIncrease the aperture ratioCathode-ray tube indicatorsInput/output processes for data processingDriver circuitElectricity
An electroluminescent (EL) device including an illumination area having one or more primary EL emitters; a reference area having a reference EL emitter; a reference driver circuit for causing the reference EL emitter to emit light while the EL device is active; a sensor for detecting light emitted by the reference EL emitter; and a measurement unit for detecting an aging-related electrical parameter of the reference EL emitter while it is emitting light. The device further includes a controller for receiving an input signal for each primary EL emitter in the illumination area, forming a corrected input signal from each input signal using the detected light and the aging-related electrical parameter, and applying the corrected input signals to the respective primary EL emitters in the illumination area.
Owner:GLOBAL OLED TECH
Electroluminescent device aging compensation with reference subpixels
ActiveUS8339386B2Accurate agingAccurate compensationCathode-ray tube indicatorsInput/output processes for data processingDriver circuitElectricity
An electroluminescent (EL) device including an illumination area having one or more primary EL emitters; a reference area having a reference EL emitter; a reference driver circuit for causing the reference EL emitter to emit light while the EL device is active; a sensor for detecting light emitted by the reference EL emitter; and a measurement unit for detecting an aging-related electrical parameter of the reference EL emitter while it is emitting light. The device further includes a controller for receiving an input signal for each primary EL emitter in the illumination area, forming a corrected input signal from each input signal using the detected light and the aging-related electrical parameter, and applying the corrected input signals to the respective primary EL emitters in the illumination area.
Owner:GLOBAL OLED TECH
Device aging determination circuit
ActiveUS6903564B1Reduce impactReduce probabilityElectronic circuit testingStatic storageEngineeringDevice Age
A device aging determination circuit. Circuits are located on a device, including a first circuit operating at a first duty cycle and generating a first output and a second circuit operating at a second duty cycle different from said first duty cycle and generating a second output. A measuring circuit determines a difference in the first output and the second output, wherein the difference indicates an aging of the device. The aging is a representation of how much degradation the device has been exposed to, and allows for dynamic adjustment of operating parameters of the device to optimize performance.
Owner:META PLATFORMS INC
Hot-carrier device degradation modeling and extraction methodologies
ActiveUS7567891B1Improve accuracySimple methodLogic circuits characterised by logic functionResistance/reactance/impedenceModel parametersEngineering
The present invention is directed to a number of improvements in methods for hot-carrier device degradation modeling and extraction. Several improvements are presented for the improvement of building device degradation models, including allowing the user to select a device parameter used to build the device degradation model independent of the device parameter selected. The user can also select the functional relation between stress time and degradation level. To further improve accuracy, multiple acceleration parameters can be used to account for different regions of the degradation process. Analytical functions may be used to represent aged device model parameters, either directly or by fitting measured device parameters versus device age values, allowing devices with different age values to share the same device model. The concept of binning is extended to include device degradation. In addition to a binning based on device width and length, age is added. In an exemplary embodiment, only devices with minimum channel length have degraded models constructed. The present invention also allows the degradation of one device parameter to be determined based on an age value derived from another parameter. In yet another aspect, a degraded device is modeled as a fresh device with a voltage source connected to a terminal.
Owner:CADENCE DESIGN SYST INC
Adaptive Device Aging Monitoring and Compensation
InactiveUS20110181315A1Marginal circuit testingIndividual semiconductor device testingGranularityEngineering
Improved device aging monitoring and compensation schemes are presented herein. In particular, embodiments enable quantitative measurement of actual aging experienced by a device up to the instant of measurement, rather than rely on static a priori estimation of aging effects under worst case conditions. As such, embodiments provide adaptive device aging monitoring and compensation schemes. In addition, embodiments allow for aging monitoring and compensation to be performed at a desired granularity, whereby aging monitoring and compensation can be performed at a chip, module, or sub-module level. Further, embodiments inherently compensate for the effects of aging on passive components (e.g., parasitics of interconnect wires, capacitors, etc.) in addition to active device aging.
Owner:AVAGO TECH WIRELESS IP SINGAPORE PTE
Multi-IGBT quick power circulation accelerated aging device
InactiveCN105301485AStability test analysis results are stable and accurateImprove accuracyCircuit interrupters testingHeat currentAccelerated aging
The invention provides a multi-IGBT quick power circulation accelerated aging device, and the device comprises a plurality of IGBT device aging stations, a heating current source for testing, and a testing current source for testing. The IGBT device aging stations are sequentially connected to form a series structure. The heating current source and the testing current source alternately supply power to the IGBT device aging stations in series connection. The device can achieve the aging testing of a plurality of IGBT devices at the same time, just needs one heating current source and one testing current source, guarantees the homogeneity of testing currents during testing, improves the work efficiency, irons out the defects of testing data in the prior art, greatly improves the accuracy of testing data, guarantees the comparability of the testing data, and guarantees the stability and accuracy of the final testing analysis results of the IGBT devices.
Owner:CHONGQING UNIV
Hot-Carrier Device Degradation Modeling and Extraction Methodologies
InactiveUS20090299716A1Improve accuracySimple methodAnalogue computers for electric apparatusComputer aided designEngineeringModel parameters
Owner:LIU ZHIHONG +5
System for controlling tube current in mixed way and control method thereof
The invention relates to a system for controlling tube current in a mixed way. The system comprises a tube current control system and a lamp filament current control system connected with the tube current control system, wherein the lamp filament current control system is connected with a lamp filament through a lamp filament current driving system. A method comprises the following steps that the tube current control system controls the tube current according to the tube current fed back by an X-ray ball tube; the lamp filament current set value is output to the lamp filament current control system; the lamp filament current control system controls the lamp filament current according to the lamp filament current set value and the lamp filament current value fed back by the lamp filament current driving system; a lamp filament current driving signal is output; the lamp filament current is controlled through controlling the lamp filament current driving system. The tube current can be precisely controlled; the accuracy and the stability can be improved; the device aging problem in the simulation technology is solved, so that the design is more flexible; the size is reduced; the cost is reduced; the system consistency is improved.
Owner:LIAONING KAMPO MEDICAL SYST
Systems and methods for utilizing an array of power storage devices, such as batteries
ActiveUS20150207355A1Avoid powerParallel/serial switchingSequential battery dischargeQuality of serviceElectrical resistance and conductance
A system for utilizing an array of electrical energy storage devices utilizes a smart manager that categorizes electrical energy storage devices in the array based on electrical energy storage device age and / or internal resistance level and causes those electrical energy storage devices with similar ages and / or resistance levels to be concurrently depleted. This is followed by concurrently depleting the electrical energy storage devices in a different category. The system also disconnects faulty electrical energy storage devices in the array and helps alleviate the need to carefully consider and reconfigure the location of individual electrical energy storage devices in the array. The system facilitates forecasting actual capacity and thus helps to guarantee available capacity and to actively maintain capacity via maintenance crews that need simply remove and replace cells as advised by the smart manager. The system 100 facilitates permitting a quality of service (QoS) to be provided to mission critical entities (banks, hospitals, etc.).
Owner:GOGORO
Optical module and optical device state monitoring system
InactiveCN107966269AAvoid messy, difficult to find wiring and other problemsLow costElectromagnetic network arrangementsOptical apparatus testingOptical ModuleComputer module
The embodiment of the invention discloses an optical module and optical device state monitoring system, an optical module and optical device temperature cycling test system and an optical module and optical device aging test system. The optical module and optical device state monitoring system comprises a main engine, test boards, to-be-tested optical modules or optical devices and fixing devices,wherein the main engine is connected with each test board through two twisted pairs respectively to form an RS485 bus network, and a communication protocol with an address and a fixed byte length isadopted for communication; each test board comprises a main MCU, an auxiliary MCU and a connector, the main MCU is used for networking communication with the main engine, and the auxiliary MCU is usedfor testing and monitoring performance parameters of the to-be-tested optical modules or optical devices and performing communication; each test board is connected with the to-be-tested optical modules or optical devices; and the test boards are in parallel connection, and together with the main engine, a bus network is formed. The working states of a large amount of optical modules or optical devices can be monitored in real time through controlling one main engine, and the construction cost, the maintenance cost and the use cost of the monitoring system are reduced.
Owner:DONGGUAN MENTECH OPTICAL & MAGNETIC CO LTD
Active matrix display compensating method
ActiveCN101595518ANo reduction in aperture ratioReduce complexityStatic indicating devicesActive matrixVoltage source
Compensating for changes in the threshold voltage of the drive transistor of an OLED drive circuit, the drive transistor includes a first electrode, second electrode, and gate electrode; connecting a first voltage source to the first electrode, and an OLED device to the second electrode and to a second voltage source; providing a test voltage to the gate electrode and connecting to the OLED drive circuit a test circuit that includes an adjustable current mirror causing voltage applied to the current mirror to be at a first test level; providing a test voltage to the gate electrode of the drive transistor and connecting the test circuit to the OLED device producing a second test level after the drive transistor and the OLED device age; and using the first and second test levels to calculate changes in the voltage applied to the gate electrode to compensate for drive transistor aging.
Owner:GLOBAL OLED TECH
Display control method and device and display device
The invention provides a display control method and device and a display device, and relates to the technical field of display. According to the display control method, actual chromaticity coordinates of sub-pixel light of a current mixed color are obtained, according to the actual chromaticity coordinates of the sub-pixel light of the current mixed color and chromaticity coordinates of sub-pixel light of basic colors, the proportion of the sub-pixel light of each basic color accounting for the sub-pixel light of the mixed color is calculated, and according to initial luminance data of sub-pixels of the basic colors and the proportion of the sub-pixel light of each basic color accounting for the sub-pixel light of the mixed color, target luminance data of the sub-pixels of the basic colors and target luminance data of sub-pixels of the mixed color are determined. The sub-pixels of the mixed color are sub-pixels of white, when a white OLED device ages, chromaticity coordinates of the sub-pixels of white are deviated, according to the proportion of the sub-pixel light of each basic color accounting for the sub-pixel light of white and the initial luminance data of the sub-pixels of the basic colors, the target luminance data of the sub-pixels of the basic colors and target luminance data of sub-pixels of white are determined, so that final display colors of an image is not deviated.
Owner:BOE TECH GRP CO LTD
Technique to improve and extend endurance and reliability of multi-level memory cells in a memory device
A novel technique to improve and extend endurance and reliability of a memory device utilizing multi-level cells is disclosed. As a memory device ages, it's reliability deteriorates. Prior to the memory device becoming completely unreliable, the memory device transitions from a multi-level cell operating mode to a reduced capacity operating mode. When operating in the multi-level cell mode, the memory system stores multiple bits per cell. The memory system stores fewer bits per cell when operating in the reduced capacity. The transition between modes is achieved by setting all bits of a particular memory page to a specific value, for example, either a logic “1” or a logic “0.”
Owner:SK HYNIX NAND PROD SOLUTIONS CORP
OLED device attenuation analysis device and attenuation analysis method
The invention discloses an OLED device attenuation analysis device and attenuation analysis method, relates to the technical field of display and aims at judging whether intrinsic attenuation occurs in a light-emitting material of a light-emitting layer of an OLED device or not. According to the OLED device attenuation analysis device, through acquisition of the light-emitting brightness of the OLED device under first and second light-emitting constraint conditions before and after the OLED device ages, a difference value function for the light-emitting brightness before and after aging is established according to the difference value of the light-emitting brightness of the OLED device under the first and second light-emitting constraint conditions before and after the OLED device ages, the function is integrated, integration results before and after aging are compared, and whether the intrinsic attenuation occurs in the light-emitting material of the light-emitting layer of the OLED device or not is judged according to a comparison result. The OLED device attenuation analysis method comprises the OLED device attenuation analysis device. The OLED device attenuation analysis device is used for OLED device attenuation analysis.
Owner:BOE TECH GRP CO LTD +1
Active matrix display compensating method
ActiveUS7928936B2Raise the ratioReduce complexityCathode-ray tube indicatorsInput/output processes for data processingActive matrixEngineering
Owner:GLOBAL OLED TECH
Semiconductor laser device aging tool
InactiveCN104330652ACurrent monitoringTemperature monitoringElectrical testingOptical apparatus testingControl powerEngineering
The invention relates to a semiconductor laser device aging tool which is characterized by comprising a main control panel, a communication connection board, multiple water cooling boards, an operation panel and a machine cabinet. The main control panel, the communication connection board and the operation panel are respectively assembled in the machine cabinet. Each water cooling board is installed in the machine cabinet via a guide rail. The main control panel is connected with an upper computer via a 485 communication mode. The communication connection board connects the water cooling boards and the main control panel via flat cables. The operation panel controls power-on and power-off of the whole system of the aging tool, and the state of each aging device is indicated. Simultaneous aging of multiple semiconductor laser devices can be realized, aging parameters of each laser device can be independently set, and current, voltage, power and temperature of the laser devices can be monitored simultaneously.
Owner:WUHAN RAYCUS FIBER LASER TECHNOLOGY CO LTD
Thermal resistance simulation and calibration system for device ageing screening lathe
InactiveCN101551423AGuaranteed accuracyImprove temperature detection accuracyElectrical testingElectrical resistance and conductanceEngineering
The invention discloses a thermal resistance simulation and calibration system for a device ageing screening lathe, which comprises a DSP controller, a constant current source circuit, a thermal resistor, a thermal resistance simulation circuit, a first difference amplification circuit, a second difference amplification circuit and a third difference amplification circuit, wherein the thermal resistor and the thermal resistance simulation circuit are connected in series with the constant current source circuit. The invention can calibrate the errors caused by sensor wiring as well as calculation and measurement completely, improves the temperature detection precision and ensures the accuracy of device screening ageing.
Owner:SHANGHAI ELECTRICAL AUTOMATION R&D INST
Active matrix display devices
An active matrix display device has an array of display pixels, each pixel comprising a current-driven light emitting display element (2), a drive transistor (22) for driving a current through the display element and pixel circuitry including an optical feedback element (38), for controlling the drive transistor to drive a substantially constant current through the display element for a duration which depends on the desired display pixel output level and an optical feedback signal of the optical feedback element. An output configuration is applied to the display which includes values for the pixel power supply voltages, the field period and an allowed range of pixel drive levels. The output configuration is varied in response to ageing of the display element. In this device, an output configuration is varied as the device ages, so that the optical feedback system can continue to provide compensation for differential ageing of the display elements for a longer period of use of the display.
Owner:KONINKLIJKE PHILIPS ELECTRONICS NV
Method for monitoring water quality monitoring system based on Internet of Things
ActiveCN109813857AAlarm in timeDetection data is reliableTesting waterData authenticityMonitoring system
The invention discloses a method for monitoring a water quality monitoring system based on Internet of Things, which is used for solving the problems that some detection devices age along with the increase of the use time, which influences the authenticity of detection data and reduces the reliability of the data. The system comprises a sample acquisition module, a sample detection module, an effective calculation module, an instrument acquisition module, an effective calculation module, a processor, a storage module, an early warning unit, a communication module, a server and a user terminal;according to the invention, a formula shown in the description is used to acquire an error scaling factor WAi of a PH sensor; a formula Hai=GAi (1+WAi) is used to acquire an actual value Hai of the PH sensor; therefore, the detection data is more accurate and reliable, the formula shown in the description is used to acquire a storage duration Cai of the actual value of the PH sensor; deleting iscarried out periodically according to the duration of the storage duration, that the server stores valid water quality parameter data is ensured.
Owner:江西电信信息产业有限公司
Sodium hypochlorite preparation system capable of being controlled and debugged remotely based on ARM single chip microcomputer and working method thereof
ActiveCN108037697AReal-time monitoring of on-site operationWith remote diagnosis and debugging functionProgramme controlComputer controlMicrocontrollerElectrolysis
The invention relates to a sodium hypochlorite preparation system capable of being controlled and debugged remotely based on an ARM single chip microcomputer and a working method thereof. The sodium hypochlorite preparation system comprises an ARM single chip microcomputer, a first drive circuit, a second drive circuit, an analog signal processing circuit, an electrolysis power supply, a concentrated salt pump, a softened water regulating valve, a softened water flow module, an operation indication module, an electrical conductivity meter, an alarm indication module, a 4G module, an HMI moduleand a wireless data transmission module. The sodium hypochlorite preparation system has a remote diagnosing and debugging function. Warning and alarm can be issued for the key parameters of system operation, so that users can find safety risks early to avoid loss caused by system device aging. Users can be remotely notified of corresponding alarm and handle the alarm, and the parameters of fieldoperation can also be modified and optimized remotely. By using the Internet-of-things technology, manufacturers and users can have a real-time understanding of the field operation situation and dealwith an abnormal situation in time.
Owner:ENERGY RES INST OF SHANDONG ACAD OF SCI +1
Heating temperature control method for device ageing screening
InactiveCN101551683AControl powerIncrease powerAuxillary controllers with auxillary heating devicesElectrical testingEngineeringHeating power
The invention discloses a heating temperature control method in device ageing screening, which comprises the following steps setting target temperature, measuring ambient temperature, calculating heating power, providing voltage triggering according to the heating power, carrying out pulse width modulation (PWM) control according to the temperature so as to control the temperature. The invention not only controls the temperature on the basis of the common heating control method, but also additionally controls the power, thereby having high control efficiency and fast control speed.
Owner:SHANGHAI ELECTRICAL AUTOMATION R&D INST
Intermittent control device for overcast machine test
ActiveCN104615041AReduce wasteReduce testing costsProgramme controlComputer controlIntermittent controlAlternating current
The invention discloses an intermittent control device for overcast machine test. The intermittent control device comprises a microprocessor module, a serial communication module, a line driving module, a relay module and a 220V alternating-current power supply. The microprocessor module is combined with the relay module, a control testing device is automatically switched on and restarted and can get rest in testing interval time by the aid of the intermittent control device on the premise of ensuring automatic testing processes, and the problems of effect on testing precision, acceleration of device aging and the like are avoided. Besides, by the aid of the intermittent control device, energy waste can be decreased, and test cost is reduced.
Owner:BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
Sensor simulation automatic calibration method of device ageing screening lathe
InactiveCN101551425AImprove work efficiencyImprove calibration accuracyElectrical testingElectrical resistance and conductanceRegulation temperature
The invention discloses a sensor simulation automatic calibration method of a device ageing screening lathe, which comprises the following steps: regulating the operating ambient temperature of the ageing screening lathe into the standard temperature TS; inputting the standard temperature TS as a setting value into a calibration unit; collecting a voltage signal VA of a sensor of one channel and obtaining the corresponding temperature T0; inputting the standard temperature TS into a simulative resistance circuit and obtaining a voltage signal VB input by the simulative resistance circuit; sampling an error signal DeltaV between the voltage signal VA and the voltage signal VB and obtaining the corresponding regulation temperature TDelta; storing the regulation temperature TDelta as a correct value in a calibration system of the channel for calibration; judging whether all channels are calibrated; and finishing the calibration. The invention can calibrate automatically and greatly improves the working efficiency and the calibration precision.
Owner:SHANGHAI ELECTRICAL AUTOMATION R&D INST
Method for establishing electrical device failure rate correction model considering overhaul influence
InactiveCN107403027ADesign optimisation/simulationSpecial data processing applicationsFailure rateElectric power system
A method for establishing an electrical device failure rate correction model considering overhaul influence comprises the following steps that 1, failure rates of an electrical device at different operating stages are analyzed; 2, a random failure period failure rate model of the electrical device is established; 3, a quantitative model about the influence of overhaul on electrical device failure rates is established; 4, a failure rate model in an electrical device ageing expiry date is established. The problem that the influence of overhaul on electrical device failure rates is not considered in the power grid risk assessment process can be solved, the failure rate is corrected after the electrical device is overhauled each time, and the electrical device failure rate level is accurately mastered, so that device failure rate settings are more accurate in the power system reliability calculating process, and improvement of the accuracy of power grid risk assessment is promoted.
Owner:STATE GRID JIANGXI ELECTRIC POWER CO +1
Ag/Ag2O-modified SnO2 porous composite and application of Ag/Ag2O-modified SnO2 porous composite to hydrogen detection
The invention discloses an Ag / Ag2O-modified SnO2 porous composite and application of the Ag / Ag2O-modified SnO2 porous composite to selective and rapid detection on a trace of hydrogen, and belongs to the technical field of gas sensing. By means of the gas-sensitive composite, a trace of hydrogen in air can be rapidly and accurately detected, the working temperature of the composite is obviously lower than that of traditional gas-sensitive materials, the service life of devices can be easily prolonged, reliability of data can be easily improved, and the requirements for energy conservation and environment protection are met. The SnO2 porous composite is used for manufacturing sensing devices used for selectively detecting a trace of hydrogen, and after the devices age for 8-24 hours at the temperature of 170 DEG C to 280 DEG C, the response value of the devices for hydrogen of 200 ppm is between 10 and 40, the response time is 2 s to 4 s, the recovery time is 28 s to 100 s, and the devices have no response to carbon monoxide or methane.
Owner:JILIN UNIV
Systems and methods for utilizing an array of power storage devices, such as batteries
ActiveUS9837842B2Avoid powerParallel/serial switchingSequential battery dischargeQuality of serviceInternal resistance
A system for utilizing an array of electrical energy storage devices utilizes a smart manager that categorizes electrical energy storage devices in the array based on electrical energy storage device age and / or internal resistance level and causes those electrical energy storage devices with similar ages and / or resistance levels to be concurrently depleted. This is followed by concurrently depleting the electrical energy storage devices in a different category. The system also disconnects faulty electrical energy storage devices in the array and helps alleviate the need to carefully consider and reconfigure the location of individual electrical energy storage devices in the array. The system facilitates forecasting actual capacity and thus helps to guarantee available capacity and to actively maintain capacity via maintenance crews that need simply remove and replace cells as advised by the smart manager. The system 100 facilitates permitting a quality of service (QoS) to be provided to mission critical entities (banks, hospitals, etc.).
Owner:GOGORO
Power grid information system device state early warning method based on reverse fuzzy hierarchical analysis
ActiveCN108108839AAdequately cope with agingAdequately respond to updatesForecastingResourcesDaily operationPower grid
The present invention discloses a power grid information system device state early warning method based on reverse fuzzy hierarchical analysis, and belongs to the technical field of power grid information system hardware device state early warning. The method comprises the steps of: constructing a difference index system reflecting an operation state of a power grid information system device; fitting a certain item daily operation curve of the device; solving an accumulated deviation value, performing mapping of 1-9 degree of the accumulated deviation value obtained by each index and the corresponding index, and obtaining a fuzzy consistent judgment matrix; calculating each index weight by employing the fuzzy consistent judgment matrix, and performing summation of weights of indexes belonging to a single device and performing averaging of the number of the indexes included by the device, and performing reverse obtaining of the weight of the single device; and making grading early warning for the operation state of the device and the information system. The method provided by the invention can fully respond to problems such as device aging or updating, business volume fluctuation and increasing of devices, can reflect change of the device state in real time, and can achieve dynamic early warning.
Owner:NORTH CHINA ELECTRIC POWER UNIV (BAODING) +3
System and method for generating a value retention schedule
Systems and methods are disclosed that generate a value retention schedule for used equipment. In one embodiment, the method includes receiving equipment sales records, determining, based on the equipment sales records, a first median sales price of a first used equipment at a first equipment age for a set of time periods, determining a second median sales price of the first used equipment at a second equipment age for the set of time periods, determining a first ratio of the second median sales price to the first median sales price for each of the time periods in the set of time periods, determining a median ratio for the first ratio across the set of time periods, determining a value retention rate for the second equipment age based on the determined median ratio; and generating the value retention schedule based on the determined value retention rate.
Owner:CATERPILLAR INC
Central air conditioner cooling tower
InactiveCN104197773AAvoid exposureAvoid sun exposureSpace heating and ventilation detailsTrickle coolersFailure rateCooling tower
The invention discloses a central air conditioner cooling tower which comprises a conical upper shell. A middle shell is arranged at the lower end of the upper shell, water pipe plates are arranged on the lower portion of the middle shell, a support is arranged at the bottom of the water pipe plate, a top opening of the upper shell is an air outlet, a motor is mounted in the upper shell and connected with a speed reducer, a fan is connected to the bottom of the speed reducer, a water distributing device and a water distributing pipes are arranged in the middle shell, water spraying padding is arranged below the water distributing device and the water distributing pipes, a disc-shaped protection hood is horizontally arranged on the top of the upper shell through a support, and the motor is mounted at the bottom of the protection hood. Compared with the prior art, the problems that a central air conditioner cooling tower is high in failure rate and quick in device aging are solved.
Owner:WUZHOU WANGJIE MACHINERY MFR
Aging performance evaluation method and platform for super junction MOS device
The invention discloses an aging performance evaluation method and platform for a super junction MOS device, and relates to the technical field of performance evaluation, and the method comprises the steps: carrying out the test scene matching, and obtaining a target acceleration test scene group; calling a plurality of aging trend curves according to the target acceleration test scene group; locally calling a historical operation data set of the to-be-tested super junction MOS device; performing degradation feature extraction on the historical operation data set to obtain multiple groups of historical operation time sequence fragments; performing degradation increment correlation prediction on multiple groups of historical operation time sequence fragments, and outputting a device aging time sequence trend curve; comparing the aging time sequence trend curve of the device based on a preset failure threshold value, and outputting the remaining service life of the device; and interactively obtaining an equipment life design index of the target power electronic system, and quantitatively outputting an aging performance evaluation result in combination with the residual service life of the device. The technical problem that the aging performance evaluation accuracy is insufficient in the prior art is solved, and the technical effect of improving the aging performance evaluation precision is achieved.
Owner:ZHEJIANG GUANGXIN MICROELECTRONICS CO LTD