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52 results about "Device Age" patented technology

A measure (or best estimate) of the length of time during which a device existed, measured from manufacture date (and time) to a given date (and time) of use. NOTE(S): Derived from the difference between the manufacture date and the date of the activity in which it is used. This is not really a characteristic of the device since the device could be used in multiple activities.

Hot-carrier device degradation modeling and extraction methodologies

The present invention is directed to a number of improvements in methods for hot-carrier device degradation modeling and extraction. Several improvements are presented for the improvement of building device degradation models, including allowing the user to select a device parameter used to build the device degradation model independent of the device parameter selected. The user can also select the functional relation between stress time and degradation level. To further improve accuracy, multiple acceleration parameters can be used to account for different regions of the degradation process. Analytical functions may be used to represent aged device model parameters, either directly or by fitting measured device parameters versus device age values, allowing devices with different age values to share the same device model. The concept of binning is extended to include device degradation. In addition to a binning based on device width and length, age is added. In an exemplary embodiment, only devices with minimum channel length have degraded models constructed. The present invention also allows the degradation of one device parameter to be determined based on an age value derived from another parameter. In yet another aspect, a degraded device is modeled as a fresh device with a voltage source connected to a terminal.
Owner:CADENCE DESIGN SYST INC

Hot-Carrier Device Degradation Modeling and Extraction Methodologies

The present invention is directed to a number of improvements in methods for hot-carrier device degradation modeling and extraction. Several improvements are presented for the improvement of building device degradation models, including allowing the user to select a device parameter used to build the device degradation model independent of the device parameter selected. The user can also select the functional relation between stress time and degradation level. To further improve accuracy, multiple acceleration parameters can be used to account for different regions of the degradation process. Analytical functions may be used to represent aged device model parameters, either directly or by fitting measured device parameters versus device age values, allowing devices with different age values to share the same device model. The concept of binning is extended to include device degradation. In addition to a binning based on device width and length, age is added. In an exemplary embodiment, only devices with minimum channel length have degraded models constructed. The present invention also allows the degradation of one device parameter to be determined based on an age value derived from another parameter. In yet another aspect, a degraded device is modeled as a fresh device with a voltage source connected to a terminal.
Owner:LIU ZHIHONG +5

Optical module and optical device state monitoring system

InactiveCN107966269AAvoid messy, difficult to find wiring and other problemsLow costElectromagnetic network arrangementsOptical apparatus testingOptical ModuleComputer module
The embodiment of the invention discloses an optical module and optical device state monitoring system, an optical module and optical device temperature cycling test system and an optical module and optical device aging test system. The optical module and optical device state monitoring system comprises a main engine, test boards, to-be-tested optical modules or optical devices and fixing devices,wherein the main engine is connected with each test board through two twisted pairs respectively to form an RS485 bus network, and a communication protocol with an address and a fixed byte length isadopted for communication; each test board comprises a main MCU, an auxiliary MCU and a connector, the main MCU is used for networking communication with the main engine, and the auxiliary MCU is usedfor testing and monitoring performance parameters of the to-be-tested optical modules or optical devices and performing communication; each test board is connected with the to-be-tested optical modules or optical devices; and the test boards are in parallel connection, and together with the main engine, a bus network is formed. The working states of a large amount of optical modules or optical devices can be monitored in real time through controlling one main engine, and the construction cost, the maintenance cost and the use cost of the monitoring system are reduced.
Owner:DONGGUAN MENTECH OPTICAL & MAGNETIC CO LTD

Display control method and device and display device

The invention provides a display control method and device and a display device, and relates to the technical field of display. According to the display control method, actual chromaticity coordinates of sub-pixel light of a current mixed color are obtained, according to the actual chromaticity coordinates of the sub-pixel light of the current mixed color and chromaticity coordinates of sub-pixel light of basic colors, the proportion of the sub-pixel light of each basic color accounting for the sub-pixel light of the mixed color is calculated, and according to initial luminance data of sub-pixels of the basic colors and the proportion of the sub-pixel light of each basic color accounting for the sub-pixel light of the mixed color, target luminance data of the sub-pixels of the basic colors and target luminance data of sub-pixels of the mixed color are determined. The sub-pixels of the mixed color are sub-pixels of white, when a white OLED device ages, chromaticity coordinates of the sub-pixels of white are deviated, according to the proportion of the sub-pixel light of each basic color accounting for the sub-pixel light of white and the initial luminance data of the sub-pixels of the basic colors, the target luminance data of the sub-pixels of the basic colors and target luminance data of sub-pixels of white are determined, so that final display colors of an image is not deviated.
Owner:BOE TECH GRP CO LTD

Sodium hypochlorite preparation system capable of being controlled and debugged remotely based on ARM single chip microcomputer and working method thereof

ActiveCN108037697AReal-time monitoring of on-site operationWith remote diagnosis and debugging functionProgramme controlComputer controlMicrocontrollerElectrolysis
The invention relates to a sodium hypochlorite preparation system capable of being controlled and debugged remotely based on an ARM single chip microcomputer and a working method thereof. The sodium hypochlorite preparation system comprises an ARM single chip microcomputer, a first drive circuit, a second drive circuit, an analog signal processing circuit, an electrolysis power supply, a concentrated salt pump, a softened water regulating valve, a softened water flow module, an operation indication module, an electrical conductivity meter, an alarm indication module, a 4G module, an HMI moduleand a wireless data transmission module. The sodium hypochlorite preparation system has a remote diagnosing and debugging function. Warning and alarm can be issued for the key parameters of system operation, so that users can find safety risks early to avoid loss caused by system device aging. Users can be remotely notified of corresponding alarm and handle the alarm, and the parameters of fieldoperation can also be modified and optimized remotely. By using the Internet-of-things technology, manufacturers and users can have a real-time understanding of the field operation situation and dealwith an abnormal situation in time.
Owner:ENERGY RES INST OF SHANDONG ACAD OF SCI +1

Power grid information system device state early warning method based on reverse fuzzy hierarchical analysis

ActiveCN108108839AAdequately cope with agingAdequately respond to updatesForecastingResourcesDaily operationPower grid
The present invention discloses a power grid information system device state early warning method based on reverse fuzzy hierarchical analysis, and belongs to the technical field of power grid information system hardware device state early warning. The method comprises the steps of: constructing a difference index system reflecting an operation state of a power grid information system device; fitting a certain item daily operation curve of the device; solving an accumulated deviation value, performing mapping of 1-9 degree of the accumulated deviation value obtained by each index and the corresponding index, and obtaining a fuzzy consistent judgment matrix; calculating each index weight by employing the fuzzy consistent judgment matrix, and performing summation of weights of indexes belonging to a single device and performing averaging of the number of the indexes included by the device, and performing reverse obtaining of the weight of the single device; and making grading early warning for the operation state of the device and the information system. The method provided by the invention can fully respond to problems such as device aging or updating, business volume fluctuation and increasing of devices, can reflect change of the device state in real time, and can achieve dynamic early warning.
Owner:NORTH CHINA ELECTRIC POWER UNIV (BAODING) +3
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