Multi-IGBT quick power circulation accelerated aging device

Abstract

The invention provides a multi-IGBT quick power circulation accelerated aging device, and the device comprises a plurality of IGBT device aging stations, a heating current source for testing, and a testing current source for testing. The IGBT device aging stations are sequentially connected to form a series structure. The heating current source and the testing current source alternately supply power to the IGBT device aging stations in series connection. The device can achieve the aging testing of a plurality of IGBT devices at the same time, just needs one heating current source and one testing current source, guarantees the homogeneity of testing currents during testing, improves the work efficiency, irons out the defects of testing data in the prior art, greatly improves the accuracy of testing data, guarantees the comparability of the testing data, and guarantees the stability and accuracy of the final testing analysis results of the IGBT devices.

Description

technical field [0001] The invention relates to a switching device testing device, in particular to a multi-IGBT rapid power cycle accelerated aging device. Background technique [0002] As a device for electric energy conversion and storage, power converters are widely used in new energy power generation, electric locomotive traction, aviation power supply, electric vehicles and other fields, but their reliability is relatively low, which seriously restricts the large-scale scale of new energy power generation. Therefore, how to evaluate and improve the reliability of power converters is one of the key problems to be solved in power electronics. [0003] IGBT devices are widely used in high-power converters and are the least reliable components in high-power converters. Therefore, the reliability analysis of IGBT devices is of great significance to the reliability of high-power converters. In order to To analyze the failure mechanism of IGBT devices and establish an effect...

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Problems solved by technology

[0002] As a device for electric energy conversion and storage, power converters are widely used in new energy power generation, electric locomotive traction, aviation power supply, electric vehicles and other fields, but their reliability is relatively low, which seriously restricts the large-scale scale of new energy power generation. Therefore, how to evaluate and improve the reliability of power converters is one of the key problems to be solved in power electronics

[0003] IGBT devices are widely used in high-power converters and are the least reliable components in high-power converters. Therefore, the reliability analysis of IGBT devices is of great significance to the reliability of high-power converters. In order to To analyze the failure mechanism of IGBT devices and establish an effective prediction model, it is necessary to conduct accelerated aging experiments on IGBT devices in order to obtain more sample data in a short period of time. In the prior art, only a single IGBT device can be accelerated. In the aging experiment, the experiments on multiple IGBT devices can only be carried out one by one, resulting in low experimental efficiency. More importantly, there is a lack of comparison experiment groups. The cost of the experiment, and there are differences between the various instruments, such as the differences in the electronic components in the experimental equipment, even if the aging experiments are carried out on multiple IGBTs at the same time, the experimental data still lacks comparability, resulting in inaccurate final analysis results

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