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77 results about "Age values" patented technology

Hot-carrier device degradation modeling and extraction methodologies

The present invention is directed to a number of improvements in methods for hot-carrier device degradation modeling and extraction. Several improvements are presented for the improvement of building device degradation models, including allowing the user to select a device parameter used to build the device degradation model independent of the device parameter selected. The user can also select the functional relation between stress time and degradation level. To further improve accuracy, multiple acceleration parameters can be used to account for different regions of the degradation process. Analytical functions may be used to represent aged device model parameters, either directly or by fitting measured device parameters versus device age values, allowing devices with different age values to share the same device model. The concept of binning is extended to include device degradation. In addition to a binning based on device width and length, age is added. In an exemplary embodiment, only devices with minimum channel length have degraded models constructed. The present invention also allows the degradation of one device parameter to be determined based on an age value derived from another parameter. In yet another aspect, a degraded device is modeled as a fresh device with a voltage source connected to a terminal.
Owner:CADENCE DESIGN SYST INC

Hot-Carrier Device Degradation Modeling and Extraction Methodologies

The present invention is directed to a number of improvements in methods for hot-carrier device degradation modeling and extraction. Several improvements are presented for the improvement of building device degradation models, including allowing the user to select a device parameter used to build the device degradation model independent of the device parameter selected. The user can also select the functional relation between stress time and degradation level. To further improve accuracy, multiple acceleration parameters can be used to account for different regions of the degradation process. Analytical functions may be used to represent aged device model parameters, either directly or by fitting measured device parameters versus device age values, allowing devices with different age values to share the same device model. The concept of binning is extended to include device degradation. In addition to a binning based on device width and length, age is added. In an exemplary embodiment, only devices with minimum channel length have degraded models constructed. The present invention also allows the degradation of one device parameter to be determined based on an age value derived from another parameter. In yet another aspect, a degraded device is modeled as a fresh device with a voltage source connected to a terminal.
Owner:LIU ZHIHONG +5

A data mining method and device

The invention provides a data mining method and device and belongs to the field of data mining. The method comprises the steps of scanning a transaction database to obtain multiple transactions and at least one item; acquiring multiple candidate item sets; for each candidate item set, calculating the weighted support degree of the candidate item set according to the weight of each item in the candidate item set and the number of specific businesses including the candidate item set; calculating the ageing value of each candidate item set according to the occurrence time of each specific business; judging whether the ageing value of each candidate item set is greater than a first threshold value and the weighted support degree is greater than a second threshold value; if the ageing value of one candidate item set is greater than the first threshold value and the weighted support degree is greater than the second threshold value, determining the candidate item set as a recent high weight frequent item set. Based on the time-based element of item sets, the probability of appearance of disturbance is reduced, and the association rules between the items in a mined recent high weight frequent item set can accurately reflect recent association rules, so that the accuracy and practicability are improved.
Owner:HARBIN INST OF TECH SHENZHEN GRADUATE SCHOOL +1

Better placement of objects reachable from outside a generation managed by the train algorithm

A garbage collector for more efficient placement of objects referenced from external references. The expected life times of these objects is measured by trial and error, by the class or type, by how often the object has been evacuated or the external reference processed, by the stability and longevity of the root source, or by the prolificness of the class or type of object. The measured value is held in the header of each object in an AGE field available for this purpose. These objects may be evacuated into existing trains or into new trains, or into a combination of existing and new trains. When new trains are created the trains are distributed among the existing trains according to a distribution contour that may be linear, normal, gamma or any other contour that might be found useful. Also, when new trains are created the youngest train must be a new train. When objects are evacuated into existing trains the objects are placed in trains according the survivability of the objects with the longer-lived objects placed proportionally in the younger trains. The objects are evacuated into the new trains from oldest to youngest trains according to the value in the AGE field. The higher the value the younger the train. A threshold on the AGE value may be established such that when the threshold is reached, the objects are evacuated into the youngest new train.
Owner:ORACLE INT CORP
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