Optical module and optical device state monitoring system

Abstract

The embodiment of the invention discloses an optical module and optical device state monitoring system, an optical module and optical device temperature cycling test system and an optical module and optical device aging test system. The optical module and optical device state monitoring system comprises a main engine, test boards, to-be-tested optical modules or optical devices and fixing devices,wherein the main engine is connected with each test board through two twisted pairs respectively to form an RS485 bus network, and a communication protocol with an address and a fixed byte length isadopted for communication; each test board comprises a main MCU, an auxiliary MCU and a connector, the main MCU is used for networking communication with the main engine, and the auxiliary MCU is usedfor testing and monitoring performance parameters of the to-be-tested optical modules or optical devices and performing communication; each test board is connected with the to-be-tested optical modules or optical devices; and the test boards are in parallel connection, and together with the main engine, a bus network is formed. The working states of a large amount of optical modules or optical devices can be monitored in real time through controlling one main engine, and the construction cost, the maintenance cost and the use cost of the monitoring system are reduced.

Description

technical field [0001] Embodiments of the present invention relate to the technical field of manufacturing and testing of optical modules and optical devices, and in particular to a state monitoring system for optical modules and optical devices, a temperature cycle testing system for optical modules and optical devices, and an aging testing system for optical modules and optical devices. Background technique [0002] With the development of optical communication technology, the demand for optical modules and optical devices in the market is increasing. Low cost and high quality are people's constant pursuit, which forces optical communication component manufacturers to continuously improve their processes to Manufacture a large number of high-quality, low-cost optical modules and optical devices. Correspondingly, it is necessary to design and manufacture equipment for aging and temperature cycle testing that can simultaneously monitor the working status of a large number of...

AI Technical Summary

Problems solved by technology

[0003] In the prior art, optical module and optical device manufacturers generally adopt USB or I2C communication channel switching technology, which can realize the simultaneous communication between one host and hundreds of optical modules, optical devices, and optical devices, but it is difficult to solve the problem of It is difficult for one host to communicate with hundreds of thousands of optical modules, optical devices, and optical devices at the same time. If multiple hosts are used for monitoring, the cost of the entire test system is very high

[0004] In addition, using USB or I2C technology, data cannot be transmitted remotely. When testing optical modules and optical devices, the host can only be placed in a harsh test environment, such as a high-temperature, dry aging room, or a high-low temperature test box. middle

Moreover, the communication line is easily interfered, resulting in a low communication rate. It takes too long to query or scan all the optical modules, optical devices or optical devices under test once, and real-time monitoring cannot be realized.

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