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OLED device attenuation analysis device and attenuation analysis method

An analysis device and device technology, which is applied in the field of OLED device attenuation analysis device, can solve the problems of OLED display service life impact, organic layer attenuation, etc.

Active Publication Date: 2016-12-21
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In the existing OLED display, each OLED unit includes an anode layer, a cathode layer, and an organic layer arranged between the anode layer and the cathode layer. The organic layer includes an electron transport layer and a hole transport layer, and an electron transport layer and a hole transport layer. The light-emitting layer between the transmission layers; and because OLED devices such as OLED displays increase with the use of time, the organic layer of the species will attenuate to a certain extent, which greatly affects the service life of the OLED display, and due to the occurrence of the organic layer There are many reasons for the attenuation. At present, there is no attenuation analysis device for OLED devices that can judge whether the luminescent material in the light-emitting layer of the OLED device has intrinsic attenuation.

Method used

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  • OLED device attenuation analysis device and attenuation analysis method

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Embodiment 1

[0073] see figure 1 and Figure 6 The OLED device attenuation analysis device provided by the embodiment of the present invention includes: a difference function construction unit 200, an integration unit 300, a comparison unit 400 and a determination unit 500 connected in sequence,

[0074] The difference function construction unit 200 is used to construct the difference function f of the luminous luminance before aging according to the difference between the luminous luminance of the OLED device under the first luminous constraint condition and the luminous luminance of the OLED device under the second luminous constraint condition before the aging of the OLED device. 1 (x); According to the difference between the luminous brightness of the OLED device under the first luminous constraint condition and the luminous luminance of the OLED device under the second luminous constraint condition after the aging of the OLED device, the luminous luminance difference function f after ...

Embodiment 2

[0133] see Figure 6 , an embodiment of the present invention provides an OLED device attenuation analysis method, including:

[0134] According to the difference between the luminous brightness of the OLED device under the first luminous constraint condition and the luminous luminance of the OLED device under the second luminous constraint condition before the aging of the OLED device, the luminous luminance difference function f before aging is constructed 1 (x); According to the difference between the luminous brightness of the OLED device under the first luminous constraint condition and the luminous luminance of the OLED device under the second luminous constraint condition after the aging of the OLED device, the luminous luminance difference function f after aging is constructed 2 (x); wherein, the first luminescence constraint condition is a single confinement environment, the single confinement environment is a variable magnetic field environment, and the second lumine...

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Abstract

The invention discloses an OLED device attenuation analysis device and attenuation analysis method, relates to the technical field of display and aims at judging whether intrinsic attenuation occurs in a light-emitting material of a light-emitting layer of an OLED device or not. According to the OLED device attenuation analysis device, through acquisition of the light-emitting brightness of the OLED device under first and second light-emitting constraint conditions before and after the OLED device ages, a difference value function for the light-emitting brightness before and after aging is established according to the difference value of the light-emitting brightness of the OLED device under the first and second light-emitting constraint conditions before and after the OLED device ages, the function is integrated, integration results before and after aging are compared, and whether the intrinsic attenuation occurs in the light-emitting material of the light-emitting layer of the OLED device or not is judged according to a comparison result. The OLED device attenuation analysis method comprises the OLED device attenuation analysis device. The OLED device attenuation analysis device is used for OLED device attenuation analysis.

Description

technical field [0001] The invention relates to the field of display technology, in particular to an OLED device attenuation analysis device and attenuation analysis method. Background technique [0002] The OLED display is an active light-emitting display device. Compared with the liquid crystal display, it has the advantages of fast response, high contrast, wide viewing angle, etc., and is widely favored by people. [0003] In the existing OLED display, each OLED unit includes an anode layer, a cathode layer, and an organic layer arranged between the anode layer and the cathode layer. The organic layer includes an electron transport layer and a hole transport layer, and an electron transport layer and a hole transport layer. The light-emitting layer between the transmission layers; and because OLED devices such as OLED displays increase with the use of time, the organic layer of the species will attenuate to a certain extent, which greatly affects the service life of the O...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50H01L51/56H10K99/00
CPCG06F2119/04G06F30/20H10K71/00H10K71/70G01R31/2635G01R31/2642G01R31/26
Inventor 许凯彭锐叶志杰胡月
Owner BOE TECH GRP CO LTD
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