Thermal resistance simulation and calibration system for device ageing screening lathe

A thermal resistance simulation and device aging technology, which is applied in the direction of instruments, measuring electricity, and measuring electrical variables, etc., can solve the problems of affecting the accuracy of temperature detection and reducing the accuracy of devices, and achieve the effect of improving temperature detection accuracy and ensuring accuracy

Inactive Publication Date: 2009-10-07
SHANGHAI ELECTRICAL AUTOMATION R&D INST
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Problems solved by technology

Errors caused by sensor wiring and calculation and measurement will seriously affect t

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  • Thermal resistance simulation and calibration system for device ageing screening lathe

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Embodiment Construction

[0018] The present invention will be further described below in conjunction with accompanying drawing.

[0019] see figure 1 , the figure shows the thermal resistance simulation calibration system for the device aging screening vehicle of the present invention, which includes a DSP controller 1, a constant current source circuit 2, a thermal resistance 3, a thermal resistance simulation circuit 4, and a first differential amplifier circuit 5. The second differential amplifier circuit 6 and the third differential amplifier circuit 7, the thermal resistor 3 and the thermal resistor analog circuit 4 are connected in series with the constant current source circuit 2, and the currents flowing through the two are exactly the same, wherein:

[0020] The constant current source circuit 2 obtains electric energy from the power supply Vcc, and generates a corresponding constant current flowing through the thermal resistance 3 and the thermal resistance analog circuit 1 according to the ...

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Abstract

The invention discloses a thermal resistance simulation and calibration system for a device ageing screening lathe, which comprises a DSP controller, a constant current source circuit, a thermal resistor, a thermal resistance simulation circuit, a first difference amplification circuit, a second difference amplification circuit and a third difference amplification circuit, wherein the thermal resistor and the thermal resistance simulation circuit are connected in series with the constant current source circuit. The invention can calibrate the errors caused by sensor wiring as well as calculation and measurement completely, improves the temperature detection precision and ensures the accuracy of device screening ageing.

Description

technical field [0001] The invention relates to a thermal resistance simulation calibration system, in particular to a thermal resistance simulation calibration system for a component aging screening vehicle. technical background [0002] The device aging screening vehicle is a large-scale electronic control product production process. It is used for aging screening of various devices. Using this equipment can improve the efficiency of device aging screening, ensure the quality of device aging screening, and avoid manual screening. kind of defect. [0003] Since the aging screening of the device aging screening vehicle is carried out under different temperature conditions, the temperature detection of each link is very important. Errors caused by sensor wiring and calculation and measurement will seriously affect the accuracy of temperature detection and reduce the accuracy of device aging screening. Contents of the invention [0004] The purpose of the present invention...

Claims

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Application Information

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IPC IPC(8): G01R31/00G01R35/00
Inventor 李新育李红词陈冰朱蕴
Owner SHANGHAI ELECTRICAL AUTOMATION R&D INST
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