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System and method for measuring compact range antenna by three reflectors

A three-mirror and antenna measurement technology, which is applied in the antenna radiation pattern, electromagnetic field characteristics, etc., to achieve the effect of wide frequency measurement, high isolation, and compact structure

Active Publication Date: 2011-11-23
北京航天元培教育科技有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the wide application of electromagnetic waves with frequencies above 300G, there is currently no antenna measurement system suitable for above 300GHz

Method used

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  • System and method for measuring compact range antenna by three reflectors
  • System and method for measuring compact range antenna by three reflectors
  • System and method for measuring compact range antenna by three reflectors

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Embodiment Construction

[0026] In order to make the object, technical solution and advantages of the present invention more clearly, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0027] In the embodiment of the present invention, in the three-mirror compact field antenna measurement system, the compact field system consists of a feed source and three reflectors. The three reflectors include a large-aperture primary reflector with a certain shape and two shaped secondary reflectors. The electromagnetic wave emitted by the feed source is reflected and focused by the first shaped sub-reflector and the second shaped sub-reflector, and finally emerges from the main reflector to obtain an output field with a flat center and steeply falling edges, as shown in figure 1 , the flat waveform area in the middle is the quiet zone suitable for measuring antennas.

[0028] The shape of the primary reflector is a sphere, ell...

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Abstract

A method for measuring a compact range antenna by three reflectors comprises the following steps of: determining a system mapping function according to the distribution of a feed source field and the distribution of a system outlet field; tracking and analyzing the electromagnetic wave emitted by the feed source by adopting a dynamic waveband tracking theory; and determining all mirror surface parameters of a first forming auxiliary reflector and a second forming auxiliary reflector by the system mapping function, the feed source field wavefront parameters and the main reflector surface parameters. The embodiment of the invention also discloses a system for measuring compact range antenna by three reflectors. The system and the method can be applicable to the feed source higher than 300GHz, and lead the system outlet field to have large quiet zone utilization coefficient (achieving more than 70%), high cross polarization isolation degree, compact structure and wide measurement frequency bands.

Description

technical field [0001] The invention belongs to the field of millimeter wave and submillimeter wave quasi-optical technology, and more specifically relates to a three-mirror compact field antenna measurement system and method. Background technique [0002] In the traditional far-field antenna test method, the minimum distance between the antenna under test and the test feed needs to reach 2D 2 / λ to meet the phase error requirements of the equiphase plane at the antenna under test, where D is the maximum aperture of the antenna under test. With the advancement of science and technology, the operating frequency of modern electromagnetic wave propagation system equipment is getting higher and higher, even reaching the millimeter wave and submillimeter wave (30G-3T) and THz frequency band. If millimeter wave or submillimeter wave is to be tested, the separation distance required in the far-field antenna test method is very large. [0003] Millimeter wave and submillimeter wav...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/08G01R29/10
Inventor 麦源俞俊生陈晓东刘绍华刘小明王宇锋徐亮苏汉生魏钦刚汪玮
Owner 北京航天元培教育科技有限公司
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