Benchmark test system and method for adjacent channel interference resisting capacity of RFID reader-writer

A technology of adjacent channel interference and benchmark testing, applied in the field of RFID, can solve the problem that the test results are no longer applicable, achieve the effects of stabilizing the electromagnetic environment, reducing coupling and interference, and improving resolution

Active Publication Date: 2010-12-29
INST OF AUTOMATION CHINESE ACAD OF SCI
View PDF3 Cites 22 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this method is only a qualitative rather than quantitative analysis. Once the application scenario or deployment point changes, the test results will no longer be applicable

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Benchmark test system and method for adjacent channel interference resisting capacity of RFID reader-writer
  • Benchmark test system and method for adjacent channel interference resisting capacity of RFID reader-writer
  • Benchmark test system and method for adjacent channel interference resisting capacity of RFID reader-writer

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be described in further detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0039] With the increasing application scale of RFID, the continuous increase of RFID hardware equipment is likely to cause overlapping coverage areas of some readers, resulting in conflicts between readers and readers, and even affect the performance of the entire RFID system. Benchmarking inter-channel communication interference between interrogators in a multi-interrogator or dense interrogator environment can avoid such conflicts. The invention provides a system and method for automatically testing the anti-adjacent channel interference ability of an RFID reader, which can artificially impose adjacent channel electromagnetic interference on the main channel in a controllable environment, and use the reader to be tested...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to benchmark test system and method for adjacent channel interference resisting capacity of an RFID (Radio Frequency Identification Device) reader-writer. The benchmark test system comprises a standard test environment, a reader transmitting antenna, a signal source transmitting antenna, a receiving antenna, an RFID, a reader antenna bracket, a signal source antenna bracket, a receiving antenna bracket, a reader-writer to be tested, a signal source, a frequency spectrum analyzer and a control computer. In the method, an adjacent channel interference signal is simulated by artificially applying an RFID reader-writer with controllable power and frequency to account the maximum adjacent channel interference strength under an acceptable reading rate so as to evaluate the adjacent channel interference resisting capacity of the RFID reader-writer scientifically and repeatedly; and under the same acceptable reading rate, the stronger the adjacent channel interference, the stronger the adjacent channel interference resisting capacity of the reader-writer to be tested. The reading rate of the reader-writer is tested by simulating the adjacent channel interference of the RFID reader-writer, therefore, the invention provides a simple, accurate and effective RFID automatic testing tool and a benchmark testing method for a user.

Description

technical field [0001] The invention relates to the field of RFID technology, in particular to a system and method for benchmarking the ability of an RFID reader-writer to resist interference from adjacent channels. Background technique [0002] The full name of RFID is radio frequency identification (Radio Frequency Identification), which is a non-contact automatic identification technology realized by radio frequency technology. RFID tags have the characteristics of small size, fast read and write speed, various shapes, long service life, reusable, large storage capacity, and can penetrate non-conductive materials. Combining RFID readers can realize multi-target identification and mobile target identification , Further, through the combination with Internet technology, it can also realize the tracking of items and the sharing of information on a global scale. RFID technology is used in logistics, manufacturing, public information services and other industries, which can g...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): H04B17/00H04B1/10H04B1/713G06K7/00G01R31/00H04B17/345
Inventor 刘禹关强刘怀达赵健
Owner INST OF AUTOMATION CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap