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Method and device for testing memory bandwidth

A test method and memory bandwidth technology, applied in the computer field, can solve the problems of low memory test efficiency and achieve the effect of improving efficiency

Active Publication Date: 2016-05-18
中科腾龙信息技术有限公司
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Problems solved by technology

[0005] Aiming at the problem of low memory test efficiency in related technologies, the present invention proposes a memory bandwidth test method and device, which can improve memory test efficiency

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  • Method and device for testing memory bandwidth

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Embodiment Construction

[0024] According to an embodiment of the present invention, a method for testing memory bandwidth is provided.

[0025] Such as figure 1 As shown, the test method of the memory bandwidth according to the embodiment of the present invention comprises:

[0026] Step S101, detecting the configuration information of the memory, determining the space of the memory, and compiling the source code for memory bandwidth testing to obtain an executable file;

[0027] Step S103, execute the executable file in parallel, and perform a bandwidth test on the memory space in a parallel manner.

[0028] In addition, the method may further include: pre-applying the largest memory space as a cache memory; and performing a bandwidth test on the memory space refers to: performing a bandwidth test on the space applied for as a cache memory. In this way, the maximum space of the entire memory can be allocated to the operating system, and the memory test can be completed by programs or processes in ...

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Abstract

The invention discloses a testing method and a testing device for memory bandwidth, wherein the testing method includes the steps: detecting configuration information of a memory, determining the space of the memory, and compiling source codes for testing the memory bandwidth so as to obtain an executable file; and parallelly executing the executable file and testing the space of the memory by means of parallelizing. By detecting the configuration information of the memory, compiling the testing source codes and parallelizing the executable file to test the memory, the testing method and the testing device are capable of completing testing of the memory by means of parallelizing, so that testing efficiency is improved.

Description

technical field [0001] The present invention relates to the computer field, and in particular, relates to a method and device for testing memory bandwidth. Background technique [0002] At present, the more common memory bandwidth testing software is mostly based on the Windows operating system, which is characterized by a graphical interface, convenient testing, and can test memory bandwidth and delay. However, there is no unified standard software for memory bandwidth testing based on the Linux operating system. restrict. [0003] At present, the industry mainly uses a memory stress test (RAMStressTest) to conduct a comprehensive test on the memory. The advantage is that the test is relatively comprehensive and reliable, but the disadvantage is that it takes too long and requires an independent test environment for memory, which is not suitable for mass production testing. [0004] Aiming at the problem of low memory test efficiency in related technologies, no effective...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F11/22
Inventor 张迎华刘建锋赵雷
Owner 中科腾龙信息技术有限公司
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