Lifetime detection method of mid-infrared solid-state laser

A technology of solid-state lasers and detection methods, which is applied in the direction of optical instrument testing, machine/structural component testing, instruments, etc., can solve the problems of long test time and long test cost, and achieve the goal of avoiding drift and reducing test consumption Effect

Active Publication Date: 2016-08-24
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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Problems solved by technology

However, for mid-infrared solid-state lasers, if the conventional life test method is used, it often takes a long time and a lot of test costs, and even the required test time is much longer than the development cycle, and it is impossible to complete the life verification before it is put into use.

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  • Lifetime detection method of mid-infrared solid-state laser

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Embodiment Construction

[0015] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0016] see figure 1 As shown, a life detection method of a mid-infrared solid-state laser comprises the following steps:

[0017] Step S101, analyze the overall structure of the mid-infrared solid-state laser, determine the key components and reliability structure model of the mid-infrared solid-state laser according to the analysis results, and assign indicators to the key components according to the reliability allocation theory, and then proceed to step S101. S102.

[0018] As a better embodiment, for a mid-infrared solid-state laser that adopts OPO (Optical Parametric Oscillator, Optical Para...

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Abstract

The invention provides a service life detecting method for an intermediate infrared solid laser. The method comprises the following steps that the key components and the reliability structure model of the intermediate infrared solid laser are determined according to the integral structure of the intermediate infrared solid laser, and index allocation is carried out on the key components according to a reliability allocation theory; the sensitive stress and the acceleration test cross sections of all the key components are determined according to the failure mechanisms of all the key components; an accelerated life test is carried out according to the sensitive stress and the acceleration test cross sections, and a mathematic model meeting distribution of single set test data is determined according to the single set test data after the accelerated life test; a service life distribution function of all the key components is determined according to the mathematic model of all the key components, and the reliability degree models of all the key components are extracted; the reliability degree model of the whole laser is determined according to the reliability degree models of all the key components and the reliability structure model, and the MTBF indexes of the intermediate infrared solid laser is calculated under set reliability degree conditions according to the reliability degree model of the whole laser.

Description

technical field [0001] The invention relates to a mid-infrared solid-state laser, in particular to a method for detecting the lifetime of a mid-infrared solid-state laser. Background technique [0002] In the infrared band, due to the absorption of the atmosphere, only three important "window areas" are left, which are 1-3 μm, 3-5 μm, and 8-12 μm, and the application of infrared lasers is mainly concentrated in 3-5 μm. Infrared band. Mid-infrared solid-state laser sources have been widely used in laser orientation, infrared remote sensing, infrared ranging, gas detection, environmental monitoring, biology, medicine and other fields. The key indicators of the mid-infrared solid-state laser, but up to now, there is no related life detection method for mid-infrared solid-state lasers. [0003] In recent years, due to the research and development of high-beam quality LD laser pumps and high-quality nonlinear optical materials in the mid- and far-infrared laser light-transmitti...

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Application Information

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Patent Type & AuthorityPatents(China)
IPC IPC(8): G01M11/00
Inventor路国光谢少锋郝明明赖灿雄黄云恩云飞
OwnerFIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH