Accelerated-storage test method for on-missile sealing pieces
An accelerated storage test and seal technology, which is applied in the field of accelerated storage test of seals on bombs, can solve the problems of not specifying the detection interval, not being able to simulate the working conditions of seals well, and failing to pass the correlation coefficient test, etc.
Inactive Publication Date: 2014-12-03
BEIJING INST OF ELECTRONICS SYST ENG
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Problems solved by technology
In the test procedure, material samples are used for the test, and the detection interval under each stress is not specified. For the upper seal, the material, shape, size, tooling, etc. are different, and only the sample is used for the test, which cannot be well simulated. The actual working conditions of seal products, therefore, need a "two-step" test method that first conducts a material test to estimate the activation energy of the material, and then conducts a product test to evaluate the product life
In the statistical method, it is recommended to use the exponential model to fit the performance degradation process, but the correlation coefficient test fails when the data obtained in the actual test uses the exponential model
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Embodiment 1
[0083] The specific steps of a "two-step" accelerated storage test method for the seal on the bomb are:
[0084] The first step is to formulate an accelerated storage test plan for the seal material, implement an accelerated storage test for the seal material, and estimate the activation energy of the seal material
[0085] Choose low-cost, easy-to-process seal materials to formulate accelerated storage test plans and carry out tests; use multiple models for regression analysis on test data to estimate the activation energy of seal materials.
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The invention discloses an accelerated-storage test method for on-missile sealing pieces. The accelerated-storage test method includes the steps of 1), making an accelerated-storage test plan for sealing piece materials, implementing the accelerated-storage test for the sealing piece materials, and evaluating activation energy of the sealing piece materials; 2), optimizing the accelerated-storage test plane for sealing piece products, implementing the accelerated-storage test for the sealing piece products, and evaluating storage life of the sealing piece products. In the method, the test is divided into to steps, namely the accelerated-storage test of the materials and the accelerated-storage test of the products, so that shortcomings of high risk and inaccurate evaluation of accelerated-storage test of the products can be directly reduced. Data statistics of the accelerated-storage tests for the on-missile sealing pieces are performed, matching of the performance degradation process of the sealing pieces is performed by the adoption of multiple models, and the models with the highest matching accuracy are selected to be calculated, so that the material activation energy obtained can be more conforms to actual products.
Description
technical field [0001] The invention relates to the technical field of accelerated storage. More specifically, it relates to an accelerated storage test method for a seal on a projectile. Background technique [0002] Accelerated storage test technology is the key technology to improve the storage life evaluation of reliable long-life products. In the engineering development stage, the accelerated storage test technology can be used to predict the storage life of the product, to expose weak links, to improve the design, and to improve the storage reliability of the product; Rapid evaluation of life expectancy provides a basis for formulating life extension plans and carrying out life extension work. Many missile-mounted equipment need to use sealing products, and the seals restrict the storage life of missiles. How to carry out accelerated storage tests of missile-mounted seals and evaluate their storage life based on tests is an urgent task in the field of missile storage...
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IPC IPC(8): G06F19/00G06F17/50
Inventor 葛蒸蒸赵文晖李玉伟王岩马巍
Owner BEIJING INST OF ELECTRONICS SYST ENG
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