8mm substrate integrated waveguide circulator failure rate detection method

A technology of substrate-integrated waveguides and detection methods, which is applied in the directions of instruments, measuring electricity, measuring devices, etc., can solve problems such as the inability to provide guidance for the technical indicators of circulators, and the failure rate calculation and detection methods of circulators are not proposed, and the detection results can be achieved. Reliable, wide-ranging results

Inactive Publication Date: 2016-06-29
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0003] The current technical data military standard GJB / Z299B-98 only provides the failure rate of a large class of circulators, and does not propose the calculation and detection method of the failure rate of each type and each frequency band of circulators, and cannot be used for a certain class Circulator specifications provide guidance

Method used

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  • 8mm substrate integrated waveguide circulator failure rate detection method
  • 8mm substrate integrated waveguide circulator failure rate detection method
  • 8mm substrate integrated waveguide circulator failure rate detection method

Examples

Experimental program
Comparison scheme
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Embodiment

[0144] The implementation example of failure rate detection and calculation of 8mm substrate integrated waveguide circulator is as follows:

[0145] The substrate in this embodiment operates at a Ka-band center frequency of 36 GHz. This type of circulator is composed of five elements (parts), and each element works independently of each other.

[0146] lambda b1 =0.00017×10 -6 / h,λ b2 =0.0011×10 -6 / h,π E = 2, π C =2,N=15

[0147] x1=0.2mm, x2=0.1mm, x3=0.05mm, x4=0.1mm, x5=0.5mm, x6=0.02mm

[0148] k 铜 =400w / mk,k 介 =0.64w / mk

[0149] tanδ=0.0018, P=25w, c 铜 =0.39×10 3 J / (kg·℃),m 铜 = 2g,m 介 =2g,m 铁氧体 =0.5g

[0150] m 磁体 = 1gh = 0.5mm, h 磁体 = 1 mm D = 0.4 mm, R 磁体 =1mm, L=8mm, ΔT=Tc=260℃

[0151] Tc2=200°C

[0152] Substituting the above data into the calculation model formula of failure rate test can get:

[0153] 1) Calculate λ G1 :

[0154] lambda G1 =(N·λ b1 +λ b2)·π E · π C

[0155] lambda G1 =(0.00017×15+0.0011)×2×2×10 -6 / h

[0156] lamb...

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Abstract

The invention discloses a detection method for the failure rate of an 8mm substrate integrated waveguide circulator, which relates to the technical field of microwave devices. The present invention includes the following steps: 1) Determining the failure rate of SIW structure λG1: 2) Determining the failure rate of metal vias λG2: 3) Determining the failure rate of SIW to microstrip λG3: 4) Determining the failure rate of ferrite cylinder λG4: 5) Determine the permanent magnet failure rate λG5; 6) Determine the overall failure rate λsp of the circulator with the following formula: λsp=λG1+λG2+λG3+λG4+λG5 The beneficial effects of the present invention are: reliable detection results and wide application range.

Description

technical field [0001] The invention relates to the technical field of microwave devices. Background technique [0002] High-frequency circulators should be widely used in military radar and microwave multi-channel communication systems, and the reliability of military communication equipment is very important, and the failure rate detection method can well judge the failure mode of the failed device, and find the most reliable The cause of failure affecting performance; and it can provide a basis for judging whether the device meets the target. [0003] The current technical data military standard GJB / Z299B-98 only provides the failure rate of a large class of circulators, and does not propose the calculation and detection method of the failure rate of each type and each frequency band of circulators, and cannot be used for a certain class The specifications of the circulator provide guidance. And this invention solves these problems, and can be extended to circulators an...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01D21/02G01R31/00
Inventor 黄陈汪晓光鲁莉娟董晨朱帅罗力兢陈良邓龙江
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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