Spatial filter debugging device and method

A technology of spatial filter and adjustment frame, which is applied in the direction of instruments, optical components, optics, etc., can solve problems such as the safety and operation risks of laser device engineering development, and achieve the effects of intuitive interference patterns, simple equipment, and high-precision measurement

Active Publication Date: 2015-04-29
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
View PDF5 Cites 15 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, this debugging method is difficult to ensure that the input and output lenses have good confocal and coaxial characteristics under the condition of vacuum in the vacuum pipeli

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Spatial filter debugging device and method
  • Spatial filter debugging device and method
  • Spatial filter debugging device and method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0024] A debugging device for a spatial filter, characterized in that the device consists of an optical fiber point light source 1, a high-quality collimating lens 2, a spatial filter adjustment frame and a supporting platform 3, a shearing interference plate 4, a ground glass screen 5, a CCD6, Composed of real-time image acquisition computer 7 and spatial filter 8;

[0025] The point light source 1 is an optical fiber point light source with a core diameter of 5.8 μm, which is located at the front focus position on the optical axis of the collimating lens 2. The Gaussian beam diverged by the optical fiber point light source is collimated by the collimating lens 2 and outputs a high-quality approximate plane wave The parallel beam of light, the fiber point light source 1 and the collimating lens 2 are fixed on the same optical platform;

[0026] The spatial filter adjustment frame and the support platform 3 are composed of a support table for placing the spatial filter to be d...

Embodiment 2

[0068] A debugging device for a spatial filter, characterized in that the device consists of an optical fiber point light source 1, a high-quality collimating lens 2, a spatial filter adjustment frame and a supporting platform 3, a shearing interference plate 4, a ground glass screen 5, and a CCD6, Composed of real-time image acquisition computer 7 and spatial filter 8;

[0069] The point light source is a fiber optic point light source with a core diameter of 5.8 μm, which is located at the front focus position on the optical axis of a high-quality collimator lens. The Gaussian beam diverged by the fiber point light source is collimated by the collimator lens and outputs a high-quality approximate plane wave Parallel beam, fiber point light source and high-quality collimating lens are fixed on the same optical platform;

[0070]The spatial filter adjustment frame and the support platform are composed of a space filter support table to be debugged and an adjustment spatial fil...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Core diameteraaaaaaaaaa
Login to view more

Abstract

The invention provides a spatial filter debugging device running on a vacuum condition and a spatial filter debugging method. The device and method have the advantages that the structure is simple, adjustment is convenient, and the debugging accuracy is high; moreover, the optical quality of a spatial filter can be evaluated by means of transverse shear interference fringes produced in the measuring process, so the assembling and calibration level and the detection level of the spatial filter can be increased, and technical studies of laser drivers can be supported.

Description

technical field [0001] The invention relates to a spatial filter, in particular to a debugging device and a debugging method for a spatial filter. Background technique [0002] Spatial filters are the core optical systems in laser devices. It is used to suppress nonlinear effects, improve the safe operating flux of the system, filter and cut off high-frequency information, and protect the laser working medium. Usually, there are a large number of spatial filters with different calibers in the laser device, the performance of the spatial filter and its adjustment are crucial to the development and later operation of the device; the core optical components of the spatial filter are those with different calibers and The focal length of the input and output optical convex lenses, so the performance of the spatial filter mainly depends on the precise adjustment and positioning installation of its input and output convex lenses. [0003] At the current level of optical processin...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G02B27/46G02B27/30G02B27/62
CPCG02B27/30G02B27/46G02B27/62
Inventor 朱海东郭爱林谢兴龙朱健强杨庆伟高奇
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap