Hierarchical fault diagnosis method for electronic information equipment

Abstract

The invention provides a hierarchical fault diagnosis method for electronic information equipment, and solves the problems that existing equipment fault diagnosis technology is low in fault detection rate and fault coverage rate, poor in fault isolation capacity and the like. The hierarchical fault diagnosis method includes the steps: firstly, analyzing an equipment fault mode: building an equipment fault model, extracting fault characteristics, and simulating, verifying and evaluating faults; secondly, building a hierarchical fault model: optimizing equipment fault mode analysis results and further reversely guiding system fault model hierarchical optimization; thirdly, building a fault diagnosis system: selecting software and hardware resources according to the fault mode analysis results and the hierarchical fault model obtained by the first step and the second step; fourthly, verifying equipment system-level fault diagnosis: finishing system-level diagnosis testing of the equipment.

Description

technical field [0001] The invention relates to the technical field of weapon equipment comprehensive testing and diagnosis, in particular to a hierarchical fault diagnosis method for electronic information equipment. Background technique [0002] In the field of comprehensive testing and diagnosis, with the increase in the complexity of electronic information weapon equipment systems, the structure of equipment is complex and the subsystems are closely connected, and its faults have the characteristics of hierarchy, correlation and comprehensiveness. At the same time, the traditional equipment fault diagnosis idea , the technical approach to realization, the composition method of the system, and the software and hardware technologies adopted have problems such as low fault detection rate, low fault coverage rate, poor fault isolation capability, and high false alarm rate, which greatly limit the combat effectiveness of equipment and cannot Meet the requirements of equipment...

AI Technical Summary

Problems solved by technology

[0003] The technical problem to be solved in the present invention is to solve the problems of low fault detection rate, low fault coverage rate and poor fault isolation ability of the existing equipment fault diagnosis technology, break through the system-level fault diagnosis technology of electronic information equipment, and build a hierarchical fault diagnosis system , to improve the efficiency and accuracy of equipment diagnosis

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