Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Serial-parallel circuit for testing ageing of multiple direct-current power supplies

A DC power supply and aging test technology, applied in the field of power supply, can solve problems such as uneven current distribution between branches of voltage source parallel circuit, aging energy dispersion of low-power DC power supply, poor adaptability of products with various capacity levels, etc., so as to facilitate popularization Use, simple structure, strong practical effect

Inactive Publication Date: 2015-06-03
XIAN ZHONGKEMAITE ELECTRONICS TECH EQUIP
View PDF0 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

China is the world's largest manufacturer of small and medium power power supply products. Traditional aging test methods cause huge waste of energy and poor adaptability to products of various capacity levels. Therefore, research on more economical and adaptable energy-saving aging test systems is of great importance. very important
[0003] However, there are still a lot of problems in the aging of small and medium power DC power supplies. Among them, the aging energy of small and medium power DC power supplies is scattered, and it is difficult to achieve cost-effective energy feedback. For voltage source parallel circuits, there may be uneven current distribution between branches or circulation phenomena, etc.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Serial-parallel circuit for testing ageing of multiple direct-current power supplies

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0018] like figure 1 As shown, the present invention includes a plurality of power supply series branches 3 connected in parallel and an inverter 1 for sending electricity into the power grid, and each of the power supply series branches 3 is used to avoid the gap between the power supply series branches 3 The commutation diode D, the voltage regulator 2 for adjusting the voltage of each series branch circuit, and a plurality of DC power supplies U connected in series, the anodes of the plurality of DC power supplies U connected in series are connected to the anodes of the diode D, The negative poles of the plurality of DC power supplies U connected in series are connected to the input terminal of the voltage regulator 2, the negative poles of the diode D are connected to the positive pole input terminal of the inverter 1, and the voltage regulator 2 The output end of the inverter 1 is connected to the negative input end of the inverter 1, and the output end of the inverter 1 ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a serial-parallel circuit for testing ageing of multiple direct-current power supplies. The serial-parallel circuit comprises a plurality of parallel power supply rail branches and an inverter, wherein each power supply serial branch consists of a diode D for avoiding commutation between the power supply serial branches, a voltage regulator for regulating voltage of each serial branch and a plurality of serial direct-current power supplies U; series-connected positive electrodes of the direct-current power supplies U are connected with a positive electrode of a diode D; series-connected negative electrodes of the direct-current power supplies U are connected with an input end of the voltage regulator; a negative electrode of the diode D is connected with a positive electrode input end of the inverter; an output end of the voltage regulator is connected with a negative electrode input end of the inverter; an output end of the inverter is connected with a power grid. The serial-parallel circuit is simple in structure, reasonable in design, convenient in wiring, high in practicability, good in using effect and convenient to popularize and use, can realize that a plurality of small-power power supplies participate in ageing simultaneously, and realizes energy recycling during ageing test of a medium-small-power power supply.

Description

technical field [0001] The invention relates to the technical field of power supplies, in particular to a series-parallel circuit for aging testing of multiple DC power supplies. Background technique [0002] As a power supply device for electronic equipment, DC power supply has been widely used in computer, communication, railway, aerospace, household appliances and other fields. In order to improve the stability and reliability of power supply products, manufacturers at home and abroad generally adopt the resistance energy consumption method to carry out aging tests on small and medium power supplies. China is the world's largest manufacturer of small and medium power power supply products. Traditional aging test methods cause huge waste of energy and poor adaptability to products of various capacity levels. Therefore, research on more economical and adaptable energy-saving aging test systems is of great importance. Very important. [0003] However, there are still a lot...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/40H02J3/38
Inventor 梁保华
Owner XIAN ZHONGKEMAITE ELECTRONICS TECH EQUIP
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products