Contact, semiconductor testing device, and semiconductor testing method
A test device and test method technology, applied in the direction of single semiconductor device testing, measuring devices, instruments, etc., can solve the problem of insufficient contact, and achieve the effects of suppressing scars, prolonging life, and reducing poor appearance
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[0041] Hereinafter, embodiments of a contact and a semiconductor testing device according to the present invention will be specifically described with reference to the drawings.
[0042] figure 1 It is a front view of a semiconductor device test contact according to an embodiment of the present invention ( figure 1 (a)) and bottom view ( figure 1 (b)). figure 1 The illustrated contact 1 is made of a conductive metal material, and includes a deformed portion 1a having a columnar shape and a connecting portion 1c protruding from one end of the deformed portion 1a. In the illustrated example, the deformed portion 1a has a substantially cylindrical shape with a diameter substantially equal to the width dimension of the upper surface of the terminal of the semiconductor device. In one example, the diameter is about 13mm and the height is about 7mm. However, the size of the deformation portion 1a is not limited to the size limited to the illustrated example, and may be a siz...
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