Automatic ripple testing device and method

Abstract

The invention discloses an automatic ripple testing device and method. The device comprises a control unit module, an input voltage conversion module, a sampling module, an oscilloscope and an upper layer interface module, wherein the control unit module controls the working process of the sampling module and the upper layer interface module; the input voltage conversion module converts and collects voltage signals of ripples to be tested to form testable coupling signals; the sampling module samples the testable coupling signals, the oscilloscope decomposes and measures received sampling data, and the upper layer interface module distributes and uploads the data. According to the device and method, automatic ripple test is used, voltage ripples output by products are real, the cost is low, consumed time is less, the efficiency is high, and the using method is simple.

Description

technical field [0001] The invention belongs to the technical field of ripple testing, and in particular relates to a device and method for automatically testing ripple. Background technique [0002] Ripple is a phenomenon caused by the voltage fluctuation of the DC stabilized power supply, because the DC stabilized power supply is generally formed by the rectification and voltage stabilization of the AC power supply, which inevitably has some The AC component, this AC component superimposed on the DC stability is called ripple. The composition of the ripple is more complex, and its shape is generally a sine wave-like harmonic with a frequency higher than the power frequency, and the other is a pulse wave with a narrow width. For different occasions, the requirements for ripple are different. For capacitors, no matter what kind of ripple, as long as it is not too large, it will generally not affect the quality of the capacitor. Therefore, the output voltage ripple of the p...

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Problems solved by technology

[0004] 1. The operation is not standardized, and the test efficiency and test quality cannot be guaranteed;

[0005] 2. It takes a lot of time and manpower to build a test environment, the stability of the test environment is poor, and the steps are cumbersome;

[0006] 3. During the test, it is necessary to manually touch the PIN pin of the product that is backfilled, which may cause poor contact and damage the test instrument and the product to be tested

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